Resources Contact Us Home
Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers

Image Number 14 for United States Patent #7265330.

Microelectronic imager assemblies comprising a workpiece including a substrate and a plurality of imaging dies on and/or in the substrate. The substrate includes a front side and a back side, and the imaging dies comprise imaging sensors at the front side of the substrate and external contacts operatively coupled to the image sensors. The microelectronic imager assembly further comprises optics supports superimposed relative to the imaging dies. The optics supports can be directly on the substrate or on a cover over the substrate. Individual optics supports can have (a) an opening aligned with one of the image sensors, and (b) a bearing element at a reference distance from the image sensor. The microelectronic imager assembly can further include optical devices mounted or otherwise carried by the optics supports.

  Recently Added Patents
Geographically self-labeling access points
Optical article comprising a temporary anti-fogging coating with improved durability
Method and system for utilizing native ethernet as a virtual memory interconnect
Information processing apparatus capable of authentication processing with improved user convenience, control program for information processing apparatus, and recording medium having control
Method of manufacturing semiconductor devices using ion implantation
Organic EL display device and method for manufacturing the same
Information storage medium, reproducing method, and recording method
  Randomly Featured Patents
Marine propeller arrangement
Semiconductor processing method and field effect transistor
Apparatus for forming a deposited film by plasma chemical vapor deposition
Coolable blade
Tank with containment chamber and gas scrubber
Pancreatic .beta. cell hexokinase transgene
Electrostatic-fluidized bed coating of wire
Current supply circuit for engine starters
Progressive gaming device
Time of flight ion trap tandem mass spectrometer system