Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Process for controlling performance characteristics of a negative differential resistance (NDR) device










Image Number 10 for United States Patent #7220636.

A variety of processes are disclosed for controlling NDR characteristics for an NDR element, such as peak-to-valley ratio (PVR), NDR onset voltage (V.sub.NDR) and related parameters. The processes are based on conventional semiconductor manufacturing operations so that an NDR device can be fabricated using silicon based substrates and along with other types of devices.








 
 
  Recently Added Patents
Display screen or portion thereof with animated graphical user interface
Data processing apparatus including reconfigurable logic circuit
Systems and methods for detecting and rejecting defective absorbent articles from a converting line
Selecting modulation and coding scheme in the presence of interference
Method and apparatus for laser strip splicing
Block copolymer nanoparticle compositions
Automated top-down multi-abstraction infrastructure performance analytics -network infrastructure-as-a-service perspective
  Randomly Featured Patents
Surgical instrument
Inflatable hull configuration and connection for a multihull vessel
Amorphous form of cell cycle inhibitor having improved solubility and bioavailability
Method of manufacturing transistor having elevated source and drain regions
Heating and cooling foods at high pressure in a continuous sterilization system
Ion beam potential detection probe
Semiconductor color detector
Utility box for bicycles
Testing equipment having refrigerator incorporated therein
Method and apparatus for performing post-process antialiasing of polygon edges