Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Process for controlling performance characteristics of a negative differential resistance (NDR) device










Image Number 10 for United States Patent #7220636.

A variety of processes are disclosed for controlling NDR characteristics for an NDR element, such as peak-to-valley ratio (PVR), NDR onset voltage (V.sub.NDR) and related parameters. The processes are based on conventional semiconductor manufacturing operations so that an NDR device can be fabricated using silicon based substrates and along with other types of devices.








 
 
  Recently Added Patents
Spalling utilizing stressor layer portions
Method, device and computer readable medium for determining whether transmission signals are present in received signals
Method for combining images and magnetic resonance scanner
Device, information processing method, and computer-readable storage medium
Hydrostatic pad pressure modulation in a simultaneous double side wafer grinder
Methods and systems for assessing sales activity of a merchant
Semiconductor device including a clock generating circuit for generating an internal signal having a coarse delay line, a fine delay line and a selector circuit
  Randomly Featured Patents
Combination of a novel fire extinguishing composition employing a eutectic salt mixture and water and a method of using same to extinguish fires
Fibronectin binding protein as well as its preparation
Sleeve separator for a lead plate
Water squirt toothbrush
Apparatus for cutting the trailing end of an expiring web
Skylight system
Smart card validation device and method
Organic-inorganic hybrid material, composition for synthesizing the same, and manufacturing method of the same
Exhaust control system for a marine vessel
Signaling tone transparent echo suppressor