Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Process for controlling performance characteristics of a negative differential resistance (NDR) device










Image Number 10 for United States Patent #7220636.

A variety of processes are disclosed for controlling NDR characteristics for an NDR element, such as peak-to-valley ratio (PVR), NDR onset voltage (V.sub.NDR) and related parameters. The processes are based on conventional semiconductor manufacturing operations so that an NDR device can be fabricated using silicon based substrates and along with other types of devices.








 
 
  Recently Added Patents
Multi-user remote health monitoring system with biometrics support
Die seal ring
System and method for stranded file opens during disk compression utility requests
Semiconductor device having a first conductive member connecting a chip to a wiring board pad and a second conductive member connecting the wiring board pad to a land on an insulator covering
Method for building taxonomy of topics and categorizing videos
Pattern forming method using printing device and method of manufacturing liquid crystal display device using the same
Representing polarized light in computer models
  Randomly Featured Patents
Ratchet operated continuous chain conveyor storage and retrieval system utilizing plurality thereof
Digital signal transmission method digital signal transmission system, digital signal transmitting apparatus and recording medium
Ethoxylated ester surfactants and a process therefor
Method and apparatus for thermalization of ions
Constant velocity joint
Configuring of an intelligent electronic device
Data error control
Method of making business forms with removable labels
Translucent coating compositions providing improved UV degradation resistance
Process for preparing shaped catalyst bodies whose active composition is a multielement oxide