Resources Contact Us Home
IC with comparator receiving expected and mask data from pads

Image Number 12 for United States Patent #7183570.

Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to be compared. The response patterns include one of expected data and mask data input on an output pad of the die/IC and the other of expected data and mask data input on another pad of the die/IC, which may be an input pad or an output pad. In addition to functional testing, scan testing of die and ICs is also possible.

  Recently Added Patents
Remote control of transmitter-side rate adaptation
Lithium ion battery pack having passive cooling
Short synthesis of tolterodin, intermediates and metabolites
Method and apparatus for synthesis of multimode x-tolerant compressor
Memory system
Method and system for providing magnetic layers having insertion layers for use in spin transfer torque memories
Multiple monochromatic print cartridge printing method separating distinct colour plane into plurality of fake colour planes to form fake colour image
  Randomly Featured Patents
Compounds and peptides that bind to the erythropoietin receptor
Key module for keyboards having a dome-shaped key member of resilient material
Removable mother/daughter peripheral card
Method for production of duroplastic, single-component polyurethanes
Obfuscation of automatically generated code
Solar collector
Use of 2-amino-4-pyridylmethyl-thiazoline derivatives as inhibitors of inducible no-synthase
Variety of geranium plant named `Penlava`
Web-up apparatus and method
System for providing visible messages during PVR trick mode playback