Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
IC with comparator receiving expected and mask data from pads










Image Number 12 for United States Patent #7183570.

Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to be compared. The response patterns include one of expected data and mask data input on an output pad of the die/IC and the other of expected data and mask data input on another pad of the die/IC, which may be an input pad or an output pad. In addition to functional testing, scan testing of die and ICs is also possible.








 
 
  Recently Added Patents
Error correct coding device, error correct coding method, and error correct coding program
Magnetic levitation motor used in lens module
Stool
Semiconductor power amplifier
Measurement protocol for a medical technology apparatus
Silicas and alkali metal salt compositions, detergents formed from such compositions and method of forming such compositions and detergents
System and method for a TCP mapper
  Randomly Featured Patents
Accompaniment system for electronic musical instrument
Gas filling apparatus and method for gas shock absorber
Floating potential conductor coupled quarter-wavelength coupled line type directional coupler comprising cut portion formed in ground plane conductor
Auto-calibration of multi-projector systems
Combined board level shielding and thermal management
Height adjustment device for imaging apparatus
Stop/start control systems and methods for internal combustion engines
Local area network for distributing data communication, sensing and control signals
Modulation depth enhancement for tone perception
Digital photo frame with a function of automatically power off