Resources Contact Us Home
IC with comparator receiving expected and mask data from pads

Image Number 12 for United States Patent #7183570.

Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to be compared. The response patterns include one of expected data and mask data input on an output pad of the die/IC and the other of expected data and mask data input on another pad of the die/IC, which may be an input pad or an output pad. In addition to functional testing, scan testing of die and ICs is also possible.

  Recently Added Patents
Video stabilization
Non-volatile flash-RAM memory with magnetic memory
Storing a location within metadata of visual media
Laser marking of a card
Configurable logic cells
Transcoded images for improved trick play
Display screen of a mobile terminal or portion thereof with a graphical user interface
  Randomly Featured Patents
Aminophenoxyacetic acid derivatives and pharmaceutical composition containing thereof
Method of measuring magnetic field error of an NMR imaging apparatus and of correcting distortion caused by the error
Fractional-N phase locked loop
Acrylamide copolymer thickener for aqueous systems
Photosensitive resin, and photosensitive composition
Method and composition for inhibiting plaque
Semiconductor memory device capable of performing an overall test thereon at a shortened time period
Device for cutting labels in a labelling machine
Impregnated cutting elements with large abrasive cutting media and methods of making and using the same
Slim five-in-one memory card adapter