Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
IC with comparator receiving expected and mask data from pads










Image Number 12 for United States Patent #7183570.

Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to be compared. The response patterns include one of expected data and mask data input on an output pad of the die/IC and the other of expected data and mask data input on another pad of the die/IC, which may be an input pad or an output pad. In addition to functional testing, scan testing of die and ICs is also possible.








 
 
  Recently Added Patents
Manufacturing process for cellular screening substratum, resultant substratum, and method and apparatus for screening
Image processing device, printing apparatus, image processing method, and method of producing printing apparatus
Print control server, print controlling method, and print control program
Vacuum switch and electrode assembly therefor
Method to prevent hyper frame number de-synchronization in a wireless communication system
Metal-containing compositions and method of making same
Plants and seeds of corn variety CV778791
  Randomly Featured Patents
Bulk material transport bag
System and method
Process for the manufacture of fibrids of thermoplastics materials
Substituted fatty ethers
Integrally formed nozzle structure with soft and hard plastics
Hydantoin esters
Gear device
Optical window signal generator
Exhaust system implementing selective catalyst flow control
Monomers and polymers for optical elements