Resources Contact Us Home
Frequency-scanning interferometer with non-specular reference surface

Image Number 4 for United States Patent #7057742.

A frequency-scanning interferometer is modified to include a diffuse reference surface. An illuminating system produces an expanding measuring beam, portions of which reflect from a test object surface and the diffuse reference surface on converging paths to an imaging system. Interference patterns between overlapping images of the object and reference surfaces are generated at a plurality of frequencies for measuring the object surface with respect to the reference surface.

  Recently Added Patents
Nonvolatile semiconductor memory device and method for manufacturing the same
Tandem electric machine arrangement
Electronic flash device
Signal activated molecular delivery
Quinoid thiophene organic photoelectric material, preparation method thereof and application thereof
Inductance element
Processor micro-architecture for compute, save or restore multiple registers, devices, systems, methods and processes of manufacture
  Randomly Featured Patents
Nozzle for use in continuous casting of steel
Virtual call center
Free flow electrophoresis method
Touch screens
Introducer sheath with expandable outer tube and method of use
Process and device for the binarization of a pattern
Self-align planerized bottom electrode phase change memory and manufacturing method
Staircase amusement slide
Electronic device and method for production