Resources Contact Us Home
Reference signal for stitching of interferometric profiles

Image Number 6 for United States Patent #6987570.

Composite height profiles are produced by taking successive interferometric measurements of different sections of a sample surface by sequentially placing them within the field of view of the instrument. A reference signal is used to provide a full history of scanner motion during each measurement scan. The reference signal is independent of the fringes collected for profile-measurement purposes and is used to produce a z-position history of the scan that is independent of scanner nonlinearities and other error sources. As a result, errors caused by scanner nonlinearity and lack of repeatability are removed from the process and it is possible to combine profiles of sections that are spatially disconnected without loss of precision attributable to scanner imperfections.

  Recently Added Patents
Shape based similarity of continuous wave doppler images
Doherty amplifier circuit
Modular connector for touch sensitive device
Electronic multiparty accounts receivable and accounts payable system
Method and system for providing complete internet anywhere with partial server processing
Passive charge cord release system for an electric vehicle
Femtocell one-to-many packet delivery
  Randomly Featured Patents
Retainer for poultry hocks
Purifying apparatus
Process for the manufacture of 3-aminophenols by dehydrogenation of 3-aminocyclohexenones
Sports ball wheel cover
Photonic switching matrix
Overhead projector
Composition for forming adhesive layer and relief printing plate using the same, and method for manufacturing relief printing plate
Simplified test element advancing mechanism having positive engagement with element
Image processing apparatus and method
Ladders for stern platforms of boats