Resources Contact Us Home
Inspection method and inspection apparatus

Image Number 18 for United States Patent #6850080.

There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection substrate and secondary coils of a device substrate are superimposed on each other so that a certain space is maintained therebetween. An AC signal is inputted into the primary coils, thereby generating an electromotive force in each secondary coil by electromagnetic induction. Then, each circuit provided on the device substrate is driven using the electromotive force and information possessed by an electromagnetic wave or electric field generated in this circuit is monitored, thereby detecting each defective spot.

  Recently Added Patents
Methods of implanting dopant ions
Method for identifying modulators of GPCR GPR1 function
Server system and method for discovering digital assets in enterprise information systems
Method and structure of forming backside through silicon via connections
High-order harmonic device of cavity filter
Multi currency exchanges between participants
Generating and using checkpoints in a virtual computer system
  Randomly Featured Patents
Apparatus and method for measuring alignment in lenticular media
Method for determining gene knockouts
Camera apparatus having drift detecting unit
Pesticidal sulfur containing amides derived from aniline and the method of preparation thereof
1-Hydroxy-2-arylazo-8-hydrocarbyloxycarbonylaminonaphthalenedisulfonic acids
Bicycle rack
Methods and apparatuses for convective polymerase chain reaction (PCR)
Method and apparatus for making glass filament or fibers
Concurrent processing of data operands
Force arrangement for radio frequency filters