Resources Contact Us Home
Inspection method and inspection apparatus

Image Number 18 for United States Patent #6850080.

There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection substrate and secondary coils of a device substrate are superimposed on each other so that a certain space is maintained therebetween. An AC signal is inputted into the primary coils, thereby generating an electromotive force in each secondary coil by electromagnetic induction. Then, each circuit provided on the device substrate is driven using the electromotive force and information possessed by an electromagnetic wave or electric field generated in this circuit is monitored, thereby detecting each defective spot.

  Recently Added Patents
Information processing device and display control method
Sterilizable film for aseptic packaging
Segmentation of a product markup image based on color and color differences
Luggage wheel housing with wheel
Vacuum cleaner
Apparatus and method for transmitting/receiving data in a communication system
Solid-state imaging apparatus and imaging system
  Randomly Featured Patents
Power control protocol for highly variable data rate reverse link of wireless communication system
Coat construction
Container post for product protection
Cheap well-behaved affine transformation of bounding spheres
Method of transferring large uncured composite laminates
Motor vehicle housing
Novel steroids
Portable water pump having a pressure control circuit with a bypass conduit
Arrangement for supporting mortar shell into barrel
Solid fuel ramjet composition