Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inspection method and inspection apparatus










Image Number 18 for United States Patent #6850080.

There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection substrate and secondary coils of a device substrate are superimposed on each other so that a certain space is maintained therebetween. An AC signal is inputted into the primary coils, thereby generating an electromotive force in each secondary coil by electromagnetic induction. Then, each circuit provided on the device substrate is driven using the electromotive force and information possessed by an electromagnetic wave or electric field generated in this circuit is monitored, thereby detecting each defective spot.








 
 
  Recently Added Patents
Optimized datacenter management by centralized task execution through dependency inversion
1,4-benzothiazepine-1-oxide derivative and pharmaceutical composition utilizing the same
Light-emitting device and luminaire
Heat collection roofing system and method for collecting heat within a roof
Substrate processing apparatus, substrate processing method and storage medium
Automobile ornament panel including an anti-glare icon area, and related automobile
Ranking clusters and resources in a cluster
  Randomly Featured Patents
Traffic alert system and method
Light fixture retrofitting apparatus and method
Corner pieces for improved duct connector
Beverage dispenser
Key button for a handset
Upper portion of an ice skate blade
Secure prompting
Thermal fatigue resistant coatings
Interactive point access financial and information system
Combined gas cap and octane reading device