Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inspection method and inspection apparatus










Image Number 18 for United States Patent #6850080.

There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection substrate and secondary coils of a device substrate are superimposed on each other so that a certain space is maintained therebetween. An AC signal is inputted into the primary coils, thereby generating an electromotive force in each secondary coil by electromagnetic induction. Then, each circuit provided on the device substrate is driven using the electromotive force and information possessed by an electromagnetic wave or electric field generated in this circuit is monitored, thereby detecting each defective spot.








 
 
  Recently Added Patents
Case for electronic device
Generating and modifying textual code interfaces from graphical programs
Hydrogenolysis of ethyl acetate in alcohol separation processes
Method for producing an adhesive fastening element made of plastic
Sacrificial spacer approach for differential source/drain implantation spacers in transistors comprising a high-k metal gate electrode structure
System and method for improving cache efficiency
High-accuracy centered fractional fourier transform matrix for optical imaging and other applications
  Randomly Featured Patents
Sling chair
Display lamp
Displaying apparatus using spatial light modulation element
Method for detecting inorganic hydrides, inorganic halides and organometallic compounds in a gas using copper hydroxide
Liquid jet head, method of manufacturing liquid jet head, and image forming apparatus
3-amido-1,2-benzoisoxazole derivatives, process for preparation, and use thereof
Sole
Weeder
Apparatus for forming stacked article groups utilizing clip-type carriers
Sterilizing container