Resources Contact Us Home
Inspection method and inspection apparatus

Image Number 18 for United States Patent #6850080.

There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection substrate and secondary coils of a device substrate are superimposed on each other so that a certain space is maintained therebetween. An AC signal is inputted into the primary coils, thereby generating an electromotive force in each secondary coil by electromagnetic induction. Then, each circuit provided on the device substrate is driven using the electromotive force and information possessed by an electromagnetic wave or electric field generated in this circuit is monitored, thereby detecting each defective spot.

  Recently Added Patents
Semiconductor device
Control device
X2 10GBASE-T transceiver with 1 Gigabit side-band support
Preparation of isomerically pure substituted cyclohexanols
Method and device for reducing image color noise
Pet urn enclosure
Local access to data while roaming with a mobile telephony device
  Randomly Featured Patents
Preparation process for block copolymers for tire tread compositions, and such copolymers
Plug connector arrangement
Process for transfusing cell containing fractions sterilized with radiation and a quencher of type I and type II photodynamic reactions
Analysis apparatus and analysis method
Detection of high grade dysplasia in cervical cells
Pixel structure and control system for controlling the same
Emergency escape system
Magnetic tape cassette case
Method for fastening parts together and resulting structure
Setting the electron gun cathode heating current of an electron beam machine