Resources Contact Us Home
Inspection method and inspection apparatus

Image Number 18 for United States Patent #6850080.

There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection substrate and secondary coils of a device substrate are superimposed on each other so that a certain space is maintained therebetween. An AC signal is inputted into the primary coils, thereby generating an electromotive force in each secondary coil by electromagnetic induction. Then, each circuit provided on the device substrate is driven using the electromotive force and information possessed by an electromagnetic wave or electric field generated in this circuit is monitored, thereby detecting each defective spot.

  Recently Added Patents
Managing breakpoints in a multi-threaded environment
Method for producing cathode active material for a lithium secondary battery
Multi-mode 3-dimensional image display apparatus
Carbon blacks having low PAH amounts and methods of making same
Semiconductor device with an amorphous semi-insulating layer, temperature sensor, and method of manufacturing a semiconductor device
Controller with screen
  Randomly Featured Patents
Chair, especially a reclining chair
Electric mixer
Methods and materials for the synthesis of organic products
Method for particulate reagent sample treatment
Method of estimating temperature of gas mixture for internal combustion engine
Apparatus and method for vasodilation
Method for curtain coating at high speeds
Vehicle luggage rack
Substrate characterization device and method for characterizing a substrate
Article carrying bag for bicycles and the like