Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Designing integrated circuits to reduce electromigration effects










Image Number 12 for United States Patent #6578178.

A method of designing an integrated circuit calculates the current density in each metal lead. The method can calculates a mean time to failure for at least one metal lead. The method can assume the metal leads are arranged in series only. The method can calculate the reliability of the integrated circuit. The method can arrange the set of metal leads by reliability. The method can divide the set of metal leads into at least two subsets, a subset requiring redesign and a subset meeting the reliability criteria. An embodiment includes an integrated circuit designed by the method taught. An embodiment includes a computer program product according to the method taught. An embodiment includes an integrated circuit including an integrated circuit designed according to the computer program product.








 
 
  Recently Added Patents
Systems and methods for excluding undesirable network transactions
Mineral, nutritional, cosmetic, pharmaceutical, and agricultural compositions and methods for producing the same
System and method for optimizing teams
Wafer recycling method
Semiconductor device
Method, apparatus and computer program product for visualizing whole streets based on imagery generated from panoramic street views
Base station, relay station, and bandwidth allocation method
  Randomly Featured Patents
Method for patterning submicron openings using an image reversal layer of material
Method for manufacturing eclectic masks
Sewing data creation apparatus and computer-readable recording medium storing a sewing data creation program
Non-symmetrical airlock for blowing wool machine
Hydrolytically-resistant boron-containing therapeutics and methods of use
Method for measuring serum cholesterol
Optical method for the characterization of the electrical properties of semiconductors and insulating films
Grain elevator
Power semiconductor devices with increased turn-off current ratings and limited current density in peripheral portions
FGF homolog polypeptides