Resources Contact Us Home
Restricting the damaging effects of software faults on test and configuration circuitry

Image Number 4 for United States Patent #6578166.

A system that restricts the damaging effects of software faults that interact with test and configuration circuitry. This test and configuration circuitry includes a scan chain in the form of a serial linkage between memory elements within a circuit, thereby allowing a test input to be serially shifted into the memory elements. The system operates by receiving a test disable signal at the circuit. In response to the test disable signal, the system moves the circuit into a test disable mode, which limits any damaging effects to the circuit caused by shifting the test input into the memory elements in the scan chain. Next, the system shifts the test input into the memory elements in the scan chain. T he system also determines whether the test input will cause damage to the circuit after the test input is completely shifted into the scan chain. If so, the system holds the circuit in the test disable mode so that the test input cannot damage the circuit. If not, the system moves the circuit out of test disable mode, and runs the circuit for at least one clock cycle in order to test the circuit.

  Recently Added Patents
3D image generating method, 3D animation generating method, and both 3D image generating module and 3D animation generating module thereof
Container pack
Transmission apparatus, receiving apparatus, method, and storage medium
Breathing mask
Communication device and method for detecting a radio signal
Passive charge cord release system for an electric vehicle
Fabrication of high gradient insulators by stack compression
  Randomly Featured Patents
High speed photographic printer using optical and digital printing with an active matrix LCD
Apparatus and method for automatically compensating for lateral runout
Permanent backwashable filter structure
Textured crystal picosecond photoresponsive element
Optical scanning device having a calibrated pixel output and method for calibrating such a device
Powder compacting presses
Soybean cultivar 5348287
Method for enabling and servicing critical interrupts while running an interrupt based debug monitor
Method and apparatus for measuring jitter in a periodic signal
One-unit type air conditioner