Resources Contact Us Home
Restricting the damaging effects of software faults on test and configuration circuitry

Image Number 4 for United States Patent #6578166.

A system that restricts the damaging effects of software faults that interact with test and configuration circuitry. This test and configuration circuitry includes a scan chain in the form of a serial linkage between memory elements within a circuit, thereby allowing a test input to be serially shifted into the memory elements. The system operates by receiving a test disable signal at the circuit. In response to the test disable signal, the system moves the circuit into a test disable mode, which limits any damaging effects to the circuit caused by shifting the test input into the memory elements in the scan chain. Next, the system shifts the test input into the memory elements in the scan chain. T he system also determines whether the test input will cause damage to the circuit after the test input is completely shifted into the scan chain. If so, the system holds the circuit in the test disable mode so that the test input cannot damage the circuit. If not, the system moves the circuit out of test disable mode, and runs the circuit for at least one clock cycle in order to test the circuit.

  Recently Added Patents
Data distribution unit for vehicle entertainment system
Electronic multiparty accounts receivable and accounts payable system
Device and method to automatically configure port forwarding
Synergistic fungicidal interactions of 5-fluorocytosine and other fungicides
Data consumption framework for semantic objects
Emergency call notification for network services
System and method for reliable packet data transport in a computer network
  Randomly Featured Patents
Fluid-dispensing pump and container provided therewith
Perturb voltage as a decreasing non-linear function of converter power
Gaming machine
Groom post
Artificial teeth holder
Paint brush with angle adjustable handle
Rolling mill roll and method of rolling
Developer cartridge having a spirally-formed feeding member mounted in a cylindrical member and method of manufacturing the same
Combined toaster and microwave oven and control method thereof