Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Query optimization system and method










Image Number 11 for United States Patent #6546381.

A query optimization system and method are particularly suitable for generating a least cost query plan expressible on a plurality of heterogeneous database schemas that are restructuring views of each other. The query optimization system receives a query against one of the tables and converts it to a plurality of alternate queries, each formatted for the particular schema of a different one of the plurality of heterogeneous tables. In generating the alternate queries, the system may utilize SchemaSQL view definitions and may employ restructuring operators expressing and capable of conducting a restructuring of a table into a restructuring view of the table. A middleware system involving a canonical schema and a virtual canonical table may also be employed to express a mapping between restructuring views for purposes of query conversion. The alternate queries may be costed and optimized and a query plan returned that has a least cost or service time involved.








 
 
  Recently Added Patents
Ion mobility spectrometers
Methods and apparatus for matching an antenna
Illumination of integrated analytical systems
Multi-stage voltage regulating circuit with automatic thermal compensation and regulating method thereof
Apparatus of adjusting optical signal transmission timing
Input device
Thickened hair colors
  Randomly Featured Patents
Helical conical spring lock-washer and method of formation thereof
Radio frequency identification device for increasing tag activation distance and method thereof
Combined housing and handle for a cable security device
Attenuation of pressure variations in crushers
Autonomous interrogatable information and position device
Automatic filling of bags
Annular port construction for valve applications
Adiabatic modulator proportioning refrigeration controller desuperheater
Fluid sampling system with an in-line probe
Method for forming polycrystalline silicon film