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Measured value processing method, a shape reconstructing method, and a shape reconstructing apparatus










Image Number 2 for United States Patent #5923773.

A method for making it possible to simply reduce accumulation of integral errors when obtaining a directing measured result by integrating measured values in a measured value group. Integrated values Ye(i) up to each measured value are obtained by means of the partial integrating method by using the even-numberth measured values in a measured value group as the respective reference values, respectively. Integrated values Yo(i) up to each measured value are obtained by means of the partial integrating method by using the odd-numberth measured values in a measured value group as the respective reference values, respectively. An average value of Ye(i) and one of the odd-numberth-reference integrated values Yo(i-1), Yo(i), and Yo(i+1) is taken as a final integrated result Y(i) up to each measured value, where i is a place number in a row of measured values.








 
 
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