Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Use of focused ion and electron beams for fabricating a sensor on a probe tip used for scanning multiprobe microscopy and the like










Image Number 3 for United States Patent #5838005.

Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning multiprobe microscopy by defining the hole within a layer disposed on the tip using focused electron or ion beams. The drilling of the hole on the apex of the tip and is stopped just as soon as the hole is defined through an overlying insulating layer under which lies a metallic or semiconductor layer at the apex. The hole is then backfilled with another metallic or semiconductor layer so that an active electrical junction is formed between the two layers through the hole in the insulating layer. The hole may be defined in conductive layers in various combinations with oxide layers, other metal layers and semiconductor materials to define Schottky diodes, thermocouple junctions, near-field optical detectors, and atomic force tips. As a result, two or more physical interactions may be simultaneously exploited between the fabricated tip and the scanned sample from which a scanned image may be produced.








 
 
  Recently Added Patents
Method for exchanging data concerning an electronic transaction
Cardiopulmonary resuscitation monitoring apparatus
Wheel
Method for parking or exiting a parking bay and for avoiding a collision of a vehicle, and corresponding assistance systems and vehicle
Cable preparation tool
Electronic device with multi-orientation
Single-wavelength correction method for luminescent homogeneous biological assay
  Randomly Featured Patents
Method and means for execution of commands accessing variable length records stored on fixed block formatted DASDS of an N+2 DASD synchronous array
Switchable DVB-H receiver
Final finish aftershave
Exhaust processor assembly
Illumination device and producing method thereof
Semiconductor module with a semiconductor stack, and methods for its production
Method for detecting protrusion height of magnetic head slider having thermally assisted head
Method of making lithium metal oxide cathode active material
Apparatus for measuring coating quality
Process for the modification of biodegradable polymers