Resources Contact Us Home
Use of focused ion and electron beams for fabricating a sensor on a probe tip used for scanning multiprobe microscopy and the like

Image Number 3 for United States Patent #5838005.

Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning multiprobe microscopy by defining the hole within a layer disposed on the tip using focused electron or ion beams. The drilling of the hole on the apex of the tip and is stopped just as soon as the hole is defined through an overlying insulating layer under which lies a metallic or semiconductor layer at the apex. The hole is then backfilled with another metallic or semiconductor layer so that an active electrical junction is formed between the two layers through the hole in the insulating layer. The hole may be defined in conductive layers in various combinations with oxide layers, other metal layers and semiconductor materials to define Schottky diodes, thermocouple junctions, near-field optical detectors, and atomic force tips. As a result, two or more physical interactions may be simultaneously exploited between the fabricated tip and the scanned sample from which a scanned image may be produced.

  Recently Added Patents
Interest point detection
Difference detecting apparatus, difference output apparatus, and medium
Highly specialized application protocol for email and SMS and message notification handling and display
Optimizing federated and ETL'd databases with considerations of specialized data structures within an environment having multidimensional constraint
Use of cocoa extract
Bullet lens design for the dasal seeker
LED string with a capability to maintain a current path and LED unit thereof
  Randomly Featured Patents
Soybean variety A1024210
Hole angularity gauge
Methods and systems for segmentation using boundary reparameterization
Light emitting diode module
Steering shock absorber for boat propeller drive units
Farfield calibration method used for phased array antennas containing tunable phase shifters
Method of producing a high quality, high resolution image from a sequence of low quality, low resolution images that are undersampled and subject to jitter
Prophylactic systems for dental instruments and methods for using the same
Arrangement for suspension of an operator cab on a work machine frame
High efficiency grit removal system