Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Use of focused ion and electron beams for fabricating a sensor on a probe tip used for scanning multiprobe microscopy and the like










Image Number 3 for United States Patent #5838005.

Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning multiprobe microscopy by defining the hole within a layer disposed on the tip using focused electron or ion beams. The drilling of the hole on the apex of the tip and is stopped just as soon as the hole is defined through an overlying insulating layer under which lies a metallic or semiconductor layer at the apex. The hole is then backfilled with another metallic or semiconductor layer so that an active electrical junction is formed between the two layers through the hole in the insulating layer. The hole may be defined in conductive layers in various combinations with oxide layers, other metal layers and semiconductor materials to define Schottky diodes, thermocouple junctions, near-field optical detectors, and atomic force tips. As a result, two or more physical interactions may be simultaneously exploited between the fabricated tip and the scanned sample from which a scanned image may be produced.








 
 
  Recently Added Patents
Image processing apparatus, image processing method, and program
System and method for optimizing utilization of inventory space for dispensable articles
Phenethanolamine derivatives for treatment of respiratory diseases
Quantitative oxygen imaging systems and methods using echo-based single point imaging
Frame syncrhonization in orthogonal frequency-division multiplexing systems
Image processing system, image processing method and program for image processing
Content display system
  Randomly Featured Patents
Plastic container
Method for manufacturing lithium-manganese oxide powders for use in lithium secondary battery
Moisture and particle getter for enclosures
Integrated color interpolation and color space conversion algorithm from 8-bit Bayer pattern RGB color space to 24-bit CIE XYZ color space
Exterior surface configuration of an interior light fixture for a motor vehicle
Object recognition using binary image quantization and Hough kernels
Universal padset concept for high-frequency probing
Centrifuge bowl having a line of weakness therein
Composite brake drum having a balancing skirt
Thermoplastic elastomer compositions having improved processing properties