Resources Contact Us Home
Semiconductor device and testing apparatus thereof

Image Number 19 for United States Patent #5828258.

A tester is connected to a signal output terminal provided in a DRAM chip, and a frequency of a clock signal output from an internal timer is monitored. The frequency of the clock signal is varied by changing the combination of 3 bit signals, so as to obtain signals by which the frequency closest to the set value is obtained. A fuse in the internal timer is disconnected to set the frequency of the clock signal so as to obtain the same state as in the case where that signal is applied.

  Recently Added Patents
Methods and apparatus for adapting network characteristics in telecommunications systems
Diazeniumdiolated phosphorylcholine polymers for nitric oxide release
Indexing, relating and managing information about entities
Monitoring agent programs in a distributed computing platform
Liquid crystal display
Solar powered charging shelter and system and method thereof
Case for electronic device
  Randomly Featured Patents
Highly integrated universal tape bonding
Display unit and support for exercise machine
Apparatus for guiding continuous fibers
Gate drive circuit
Automatic flashover protection for locomotive traction motors
Coin counting device
System for discovering and producing polypeptides that cause TNF receptor shedding
Lubricant for magnetic disk, process for producing the same, and magnetic disk
Method of producing thickened electrolyte for primary cell
Cartridge for drug infusion pump