Resources Contact Us Home
Semiconductor device and testing apparatus thereof

Image Number 19 for United States Patent #5828258.

A tester is connected to a signal output terminal provided in a DRAM chip, and a frequency of a clock signal output from an internal timer is monitored. The frequency of the clock signal is varied by changing the combination of 3 bit signals, so as to obtain signals by which the frequency closest to the set value is obtained. A fuse in the internal timer is disconnected to set the frequency of the clock signal so as to obtain the same state as in the case where that signal is applied.

  Recently Added Patents
Container pack
Control service for relational data management
Termite tubing preventative for non-wood materials
Method and system for selecting a target with respect to a behavior in a population of communicating entities
Wireless updating of hearing devices
Optical article including an antireflecting coating having antifog properties and process for making same
Measurement protocol for a medical technology apparatus
  Randomly Featured Patents
Disk cartridge having identification element and disk drive apparatus which recognizes the identification element
Method for automating validation of integrated circuit test logic
Method for producing optically active 1-(4-t-butylphenyl)-5-oxo-3-pyrrolidine carboxylic acid and/or an enantiomeric ester thereof
Analog amplifier having DC offset cancellation circuit and method of offset cancellation for analog amplifiers
System and method for decoding a message using a priori information
Secure electrically programmable fuse
Microporous crumbs of hydrogenated block copolymers and process for producing the same
Audio jack connector with improved soldering tail
Ladder step