Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method of and apparatus for measuring lifetime of carriers in semiconductor sample










Image Number 9 for United States Patent #5760597.

In addition to microwave and excitation light, bias light as well is irradiated upon a surface of a semiconductor sample that is passivated using a solution which contains an electrolyte. Irradiation of the bias light increases the quantity of ionic substances that exist in the solution, largely changes a surface potential of the semiconductor sample, and suppresses surface recombination. This makes it possible to measure the lifetime of carriers which exist within the semiconductor sample at a high accuracy, without influenced by surface recombination.








 
 
  Recently Added Patents
Vehicle detection apparatus and method using magnetic sensor
Voltage detector having voltage detection printed board
Soybean cultivar CL0911610
Pear tree named `PremP109`
Process for making thermoplastic polymer pellets
Image forming apparatus and system connectable with an authorization apparatus via a communications network, the image forming apparatus comprising an apparatus control section, an initial inq
Reduction of HMF ethers with metal catalyst
  Randomly Featured Patents
Image forming apparatus
Internal combustion engine
Device and method of programming a magnetic memory element
Portable aesthetic component comparison system, decorator design tool, retaining stud, and method
Method for manufacturing a magnetic dipole antenna
Collapsible jack
Image processing device and image processing method performing color conversion processing using a lookup table
Methods and systems for producing fuel compositions
Multi-compartment container system
Power supply for automatically supplying a proper voltage to a central processing unit