Resources Contact Us Home
Method of and apparatus for measuring lifetime of carriers in semiconductor sample

Image Number 9 for United States Patent #5760597.

In addition to microwave and excitation light, bias light as well is irradiated upon a surface of a semiconductor sample that is passivated using a solution which contains an electrolyte. Irradiation of the bias light increases the quantity of ionic substances that exist in the solution, largely changes a surface potential of the semiconductor sample, and suppresses surface recombination. This makes it possible to measure the lifetime of carriers which exist within the semiconductor sample at a high accuracy, without influenced by surface recombination.

  Recently Added Patents
Computer program, system, and method for mapping Social Security claiming strategies
Polyester resin for toner, electrostatic charge image developing toner, electrostatic charge image developer, toner cartridge, process cartridge, image forming apparatus, and image forming met
Cryptographic key split combiner
High electron mobility transistor and manufacturing method thereof
Method of treating cancer using a survivin inhibitor
Anti-fake battery pack and identification system thereof
Device and method for unified codes
  Randomly Featured Patents
Organic electrolyte secondary cell
Utility pack
Maxillary protraction device with chin-cup
System and method for assigning management responsibility for manageable entities
Sensor for direct measurement of carbonate ions in seawater
Rocket vehicle thrust augmentation within divergent section of nozzle
Methods and systems for merging data during cache checking and write-back cycles for memory reads and writes
Co-axial injection system
Recloser undervoltage lockout mechanism
Method and apparatus for anticipatory selection of external or internal addresses in a synchronous memory device