Resources Contact Us Home
Method of and apparatus for measuring lifetime of carriers in semiconductor sample

Image Number 9 for United States Patent #5760597.

In addition to microwave and excitation light, bias light as well is irradiated upon a surface of a semiconductor sample that is passivated using a solution which contains an electrolyte. Irradiation of the bias light increases the quantity of ionic substances that exist in the solution, largely changes a surface potential of the semiconductor sample, and suppresses surface recombination. This makes it possible to measure the lifetime of carriers which exist within the semiconductor sample at a high accuracy, without influenced by surface recombination.

  Recently Added Patents
Table base
Closed-loop adaptive adjustment of pacing therapy based on cardiogenic impedance signals detected by an implantable medical device
Method for forming a film
Piezoelectric quasi-resonance linear motors based on acoustic standing waves with combined resonator
Unsupervised document clustering using latent semantic density analysis
Signal routing dependent on a loading indicator of a mobile node
Reception circuit and signal reception method
  Randomly Featured Patents
Printer with multimedia server
Use of liquefied propane and butane or butane recycle to control heat of reaction of converting olefins to gasoline and distillate
Freeze-drying process
Merchandise display hook for fishing rods
Stamp pad container
Systems and methods for memory read response latency detection
Air conditioner
Network control system for home appliances
Process for preparing arylisothiocyanates
Methods for packaging microelectronic devices and microelectronic devices formed using such methods