Resources Contact Us Home
Method of and apparatus for measuring lifetime of carriers in semiconductor sample

Image Number 9 for United States Patent #5760597.

In addition to microwave and excitation light, bias light as well is irradiated upon a surface of a semiconductor sample that is passivated using a solution which contains an electrolyte. Irradiation of the bias light increases the quantity of ionic substances that exist in the solution, largely changes a surface potential of the semiconductor sample, and suppresses surface recombination. This makes it possible to measure the lifetime of carriers which exist within the semiconductor sample at a high accuracy, without influenced by surface recombination.

  Recently Added Patents
Pixel interleaving configurations for use in high definition electronic sign displays
Hydrolases, nucleic acids encoding them and methods for making and using them
Soybean cultivar CL1013663
Method and system for providing an intelligent visual scrollbar position indicator
Maize hybrid X95C382
Generating a network map
  Randomly Featured Patents
Control device for automatically stopping swiveling of cranes
Vehicular headlamp and car headlamp
Method and apparatus for constructing and grading objective examinations
Piston ring having wear resistant composition
Encapsulated product and method of manufacture
Modified gas gauge
Electrodynamic sound generator for hearing aids
Pneumatically self-regulating valve
Inkjet head, filter plate for inkjet head, and method of manufacturing filter plate
Gardening stool