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Measurement of material properties with optically induced phonons

Image Number 16 for United States Patent #5633711.

Samples such as thin polymeric films are analyzed using optically induced phonons by excitation of the sample using radiation preferably absorbed by the sample and probe radiation, preferably not absorbed by the sample, that is diffracted from the surface of the sample. The pulse width of the probe is preferably on the order of the detectable diffraction signal so that the phonon decay from each excitation pulse can be detected and analyzed. The technique is applicable to various samples by inducing a ripple morphology on the sample surface and detection of light diffracted substantially from surface ripple.

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