Image Number 17 for United States Patent #5557559.
In association with a burn-in system for the accelerated life testing of semiconductor devices, of the type including a burn-in driver universally reconfigurable by computer control, a computer software system and method combining interactive systems for designing projects having data for reconfiguring the driver, designing test sequences having data for controlling semiconductor burn-in, designing oven chamber and driver and burn-in board configurations for use in burn-in control, controlling burn-in testing, diagnosing hardware problems, and providing system security. The software system of a multi-purpose computer controlled driver system functions with and controls the burn-in system hardware to accomplish the signal conditioning and testing during the same time period of a wide variety of devices quickly and efficiently with a minimum of system setups and change-overs.
|
