Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Industrial controller with coordinated timing










Image Number 3 for United States Patent #5519726.

A method for providing a standard coordinated time throughout spatially separated functional modules of an industrial controller employs a module operating as a time-master which transmits a coordinated time value to various dependent modules through communication modules. The particular time-master is determined by an arbitration process among potential masters which examines a time quality value, indicating the precision of the time-master's clock, and incorporated in the transmitted synchronization signal. Upon the loss of a master or the introduction of a new master, mastership is reallocated so that the master time value is provided from that module having the best time quality. Offset caused by "ripple through" of the time value through communication modules is minimized by summing to that time value as it traverses a communication module with a time quantity measuring the processing time of the communication module.








 
 
  Recently Added Patents
Modular sport center
Compounds, compositions and use
Plate
Efficient relay automatic repeat request procedure in broadband wireless access system
Inspection tool for top guides of a boiling water reactor
Rechargeable battery
Fusion of road geometry model information gathered from disparate sources
  Randomly Featured Patents
Method of using an electrolysis apparatus with a pulsed, dual voltage, multi-composition electrode assembly
Application apparatus for holding in readiness a substance to be applied
External rearview mirror for motor vehicles
Authentication agent apparatus, authentication method, and program product therefor
Gas discharge tube capable of lighting in different colors
Toy slot racing vehicle sets
Bottle breaking apparatus
Temporary printer firmware upgrade
Method and apparatus for detecting objects dragging beneath a train
Schottky barrier diodes for millimeter wave SiGe BiCMOS applications