Resources Contact Us Home
Method of making superhard tips for micro-probe microscopy and field emission

Image Number 4 for United States Patent #5393647.

Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip of a first material, such as silicon. The tips are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about C. and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si.sub.3 N.sub.4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.

  Recently Added Patents
Simulating non power of two texture behavior
Bioreactor device, and method and system for fabricating tissues in the bioreactor device
Hand-held electronic display device
Semiconductor fin device and method for forming the same using high tilt angle implant
System for non-destructive image processing
Automatic pill dispenser
Performing a cyclic redundancy checksum operation responsive to a user-level instruction
  Randomly Featured Patents
Disc brake with fluid cooled actuator
Method for depositing pure metal halide compositions
Method and system for modifying executable code to add additional functionality
Non-volatile semiconductor memory device adapted to store a multi-valued data in a single memory cell
Sample analyzer
Method and apparatus for moving in formation the modular components of a drilling rig from well to well
Stroller seat assembly with calf support
Method and system for limiting content diffusion to local receivers
High speed data and coverage using personal area network
Curing unit for dental materials