Resources Contact Us Home
Method of making superhard tips for micro-probe microscopy and field emission

Image Number 4 for United States Patent #5393647.

Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip of a first material, such as silicon. The tips are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about C. and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si.sub.3 N.sub.4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.

  Recently Added Patents
Locking flange
Bipolar junction transistor with a self-aligned emitter and base
Frequency offset estimation apparatus and method of OFDM system
Method for testing multi-chip stacked packages
Communication system and data transmission method thereof
Clothing fastener accessory
Stroboscopic light source for a transmitter of a large scale metrology system
  Randomly Featured Patents
Xenon production system
Wire harness connection structure
Beverage packaging method and apparatus
Hydraulically powered fan system for vehicles
Method, composition and kit for stabilizing radiolabeled compounds
Compact wide scan periodically loaded edge slot waveguide array
Display and storage stand for recording media
Bipolar analog multipliers for low voltage applications
Systems and methods for sending power control information
Electrophotographic toner for high speed electrophotography