Resources Contact Us Home
Method of making superhard tips for micro-probe microscopy and field emission

Image Number 4 for United States Patent #5393647.

Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip of a first material, such as silicon. The tips are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about C. and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si.sub.3 N.sub.4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.

  Recently Added Patents
Pharmaceutical dosage form
Video stabilization
Stabilization of dicarbonate diesters with protonic acids
Methods and apparatus for power amplifier calibration
Solar powered charging shelter and system and method thereof
Process for preventing polymerization of cracked volatile products during pyrolysis and gasification
Data processing apparatus, activation control method, and computer-readable storage medium
  Randomly Featured Patents
Apparatus and method for testing engine air intake systems
Arrangement of a disk spring at a piston of a switching element
Quick connector for fluid conduit
Memory cards including a standard security function
Electrodeless fluorescent lamp with optimized amalgam positioning
Height and angle adjustable utility access device and method
FCC process with rapid separation of products
Single lever bi-directional inertia latch
Planar magnetic thin film head
Solid acid electrolytes for electrochemical devices