Resources Contact Us Home
Method of making superhard tips for micro-probe microscopy and field emission

Image Number 4 for United States Patent #5393647.

Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip of a first material, such as silicon. The tips are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about C. and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si.sub.3 N.sub.4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.

  Recently Added Patents
Electric separator, method for the production and use thereof
Preserving user applied markings made to a hardcopy original document
Power storage device and method for manufacturing the same
Mobile communication device monitoring systems and methods
Methods and systems for representing missed approach information in perspective view on a cockpit display
Cache memory control device, semiconductor integrated circuit, and cache memory control method
  Randomly Featured Patents
USB device with plastic housing having integrated plug shell
Diastereomer salt of optically active quinolinemevalonic acid
System and method for organizing data
Cleaner handle and cleaner handle housing sections
Roof ridge ventilator
Wax, scraper and buffer combination device for tuning skis and snowboards
Method and apparatus for scrambling and unscrambling bar code symbols
Rhizoxin derivatives and their use as anti-tumor agents
Foldable workbench
Front structure of a motor vehicle