Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method of making superhard tips for micro-probe microscopy and field emission










Image Number 4 for United States Patent #5393647.

Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip of a first material, such as silicon. The tips are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about 1000.degree. C..+-.200.degree. C. and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si.sub.3 N.sub.4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.








 
 
  Recently Added Patents
Methods and apparatus for processing audio signals
Visualization of information associated with applications in user interfaces
3D structured memory devices and methods for manufacturing thereof
Maize variety inbred PH1CD7
Method and apparatus for optimizing transmission diversity
Sub-resolution assist feature repair
Cylindrical lithium secondary battery comprising a contoured center pin
  Randomly Featured Patents
Frame synchronizing device
Friction connector for anchoring reinforcement tendons in reinforced or pre-stressed concrete girders
Remotely controllable circuit breaker
Comparator for input voltages higher than supply voltage
Icon for a portion of a display screen
Non-impact printing method
Reduced noise positive drive power transmission system
Construction system
Air caloric stimulation system
Catalyzed process for reacting carboxylic acids with vinyl ethers