Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method for the on-line nondestructive measurement of a characteristic of a continuously produced










Image Number 4 for United States Patent #5373545.

The process measures a characteristic (X) which is difficult to measure of a continuously produced product and comprises:choosing at least one easily measurable second characteristic (Y) whose variations are correlated to the variations of the first characteristic;modifying, by means acting on the product in a given zone of the production line, the first characteristic so as to put it into a known predetermined reference state (X.sub.o);taking at least in said zone a measurement of the second characteristic, and;processing said measurement for determining a variation in the first characteristic relative to the reference state (X).Application in the measurement of the flatness of a strip continuously travelling through a levelling machine.FIG. 2.








 
 
  Recently Added Patents
Catalysts and process for producing aldehydes
One-dimensional metal nanostructures
Method of measuring a displacement amount for an automobile suspension assembly
Methods and systems for determining the reliability of transaction
Fabrication method of semiconductor device and fabrication method of dynamic threshold transistor
Ink composition, ink for inkjet recording and ink set using the ink
Lightweight multicast method and apparatus for data distribution service
  Randomly Featured Patents
Package having shield case
Z buffer initialize and update method for pixel block
Method for the preparation of an enantiomerically pure benzazepine
Ultraviolet ray irradiation equipment having scrapper rings fitted to light transmission tubes
Method and an apparatus for determination of basic values
Methods and materials for obtaining phenotypic females despite androgen administration
Surfactant mixtures
Predictive discrete latent factor models for large scale dyadic data
Printing apparatus and control method
Two-level guarded predictive power gating