Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Heterodyne interferometer arrangement










Image Number 6 for United States Patent #5331400.

A heterodyne interferometer arrangement comprises a two-frequency light source, an optical reference branch for producing a reference signal, an optical measuring branch, which includes an interferometer unit causing a phase rotation of the light beams in response to a length to be measured, as well as a measuring transducer arranged at the output of the interferometer unit, and a phase comparator arranged subsequent to the reference transducer and the measuring transducer. In order to minimize linearity errors, the measuring transducer comprises first and second optoelectric measuring transducer units, which respond to light components orthogonal to each other and which are followed by two phase comparators whose output signals represent phase differences between the first or the second measuring signal on the one hand and the reference signal on the other, and a mean value generation circuit whose output signal represents the mean value of the first and second phase differences. The mean value of the phase differences is virtually free from non-linearity.








 
 
  Recently Added Patents
Method and apparatus for laser strip splicing
Decrementing settings for a range of power caps when a power cap is exceeded
Mixture, especially spinning solution
Bicycle carrier
Method for preventing wheat from mycotoxin contamination
Encoder that optically detects positional information of a moving body from different optical paths lengths
Enhanced telephony services
  Randomly Featured Patents
Ultrasound imaging device
Halogen lamp
Circuit board and process for manufacturing same
Method for detecting a structured target
Air freshener
Systematic displacement screw
Level
Zero insertion force connector clip assembly
Radiator for heat generating components in electronic equipment
Device for detecting playing pieces on a board