Resources Contact Us Home
Electro-optical interferometric microdensitometer system

Image Number 5 for United States Patent #5255069.

There is disclosed an interferometric system including electro-optical apparatus and method for examining and characterizing ultra fine details of various specimens such as a piece of photographic film. The method includes illuminating a specimen with a thin wide substantially pure Gaussian light beam, detecting the interfering patterns of light from the specimen, and characterizing ultra fine details of elements of the specimen by means of the detected light patterns. The apparatus includes a laser, a magnifying telescope, a multi-prism beam expander, and a linear array of photo-diodes. Signals from the photo-diodes are displayed on an optical multichannel analyzer (OMA) to provide a waveform characteristic of ultra fine elements of the specimen. Both "near-field" and "far-field" characterizations are possible and details of elements having diameters of the order of the wavelength of the light used (e.g., about 0.6 .mu.m) are detected.

  Recently Added Patents
Security authentication method, apparatus, and system
Pipette device
Inductive signal transfer system for computing devices
Flame-retardant polyamide composition
Simultaneous image distribution and archiving
Power-on reset circuit
Method and an apparatus for processing an audio signal
  Randomly Featured Patents
Magnetic thin film magnetic recording medium
Method of treating the surface of polymers with a cuprous compound to form a copper sulfide composite structure
Diazamerocyanines for dyeing keratinous fibers
Water treatment polymers and methods of use thereof
Purge control system of engine
Method and apparatus for automatically tracking a moving object
Housing for a fire and smoke detector
Electronic dictionary with speech function
Coating solution for applying tensioning coatings to electrical steel strip
Refrigerant copper line protector and method of repairing