Resources Contact Us Home
Electro-optical interferometric microdensitometer system

Image Number 10 for United States Patent #5255069.

There is disclosed an interferometric system including electro-optical apparatus and method for examining and characterizing ultra fine details of various specimens such as a piece of photographic film. The method includes illuminating a specimen with a thin wide substantially pure Gaussian light beam, detecting the interfering patterns of light from the specimen, and characterizing ultra fine details of elements of the specimen by means of the detected light patterns. The apparatus includes a laser, a magnifying telescope, a multi-prism beam expander, and a linear array of photo-diodes. Signals from the photo-diodes are displayed on an optical multichannel analyzer (OMA) to provide a waveform characteristic of ultra fine elements of the specimen. Both "near-field" and "far-field" characterizations are possible and details of elements having diameters of the order of the wavelength of the light used (e.g., about 0.6 .mu.m) are detected.

  Recently Added Patents
Method and system for detecting target objects
RF/optical shared aperture for high availability wideband communication RF/FSO links
Nitrogen-doped carbon-supported cobalt-iron oxygen reduction catalyst
PCSK9 antagonists
Methods and apparatus to provide haptic feedback
Multifunction switch for vehicle having lighting module
Remote management of networked systems using secure modular platform
  Randomly Featured Patents
Probe for electronic clinical thermometer
Chain cover of internal combustion engine
Method for generating a gamma table
Inflatable and ventilating upper for an article of footwear
Golf bag support
Image forming device having exposure unit provided to first device body rotataby joined to second device body
System for transmitting a video stream over a computer network to a remote receiver
Nail magazine structure of a power nailer
Block filter