Resources Contact Us Home
Electro-optical interferometric microdensitometer system

Image Number 10 for United States Patent #5255069.

There is disclosed an interferometric system including electro-optical apparatus and method for examining and characterizing ultra fine details of various specimens such as a piece of photographic film. The method includes illuminating a specimen with a thin wide substantially pure Gaussian light beam, detecting the interfering patterns of light from the specimen, and characterizing ultra fine details of elements of the specimen by means of the detected light patterns. The apparatus includes a laser, a magnifying telescope, a multi-prism beam expander, and a linear array of photo-diodes. Signals from the photo-diodes are displayed on an optical multichannel analyzer (OMA) to provide a waveform characteristic of ultra fine elements of the specimen. Both "near-field" and "far-field" characterizations are possible and details of elements having diameters of the order of the wavelength of the light used (e.g., about 0.6 .mu.m) are detected.

  Recently Added Patents
System for purifying air through germicidal irradiation and method of manufacture
System for non-destructive image processing
Backup and recovery of distributed storage areas
Mirror drift compensation in an optical circuit switch
Error protection for pipeline resources
System and method for ensuring compliance with organizational policies
  Randomly Featured Patents
Oxygen-containing organic compounds as boundary lubricants for silicon nitride ceramics
Storage and maintenance system
Wheel suspension system
Vehicle wheel
Multiple-invariant space-variant optical processing
Ink cartridge for printer
Smoking and baking apparatus
Selecting prospective bidders to whom to promote an online auction based upon bidding history
Process for producing an antibacterial fiber article
Pet carrier