Resources Contact Us Home
Vehicle cap window and hinge therefor

Image Number 2 for United States Patent #5072984.

A frameless truck cap lift door is disclosed having a concealed hinge structure and including a transparent window portion of generally uniform thickness having six holes, two of which extend along an upper edge thereof. There is a relatively rigid support bar having at least a pair of holes which are simutaneously alignable with the window holes. A pair of hinges are adapted to be fastened near an upper edge of the truck cap each hinge having a pivotable arm extending from the truck cap and terminating in an apertured flange. The spacing between the flanges when the hinges are fastened to the truck cap is substantially the same of the spacing between the holes in the support bar and the holes in the window whereby a pair of threaded fasteners may be passed each through the window, the support bar and one flange for securing the window pivotably to the cap. This eliminates any need for a window frame whereby facilitating use of any of a wide variety of window shapes while allowing the use of relatively thin glass for the window.

  Recently Added Patents
Solid-state imaging apparatus
Weight-balanced polygonal mirror, light scanning unit using the polygonal mirror, and image forming apparatus
Compounds, compositions and use
Architectural panel with millet and grass
Expressive grouping for language integrated queries
Resource compatability for data centers
Memory device and self interleaving method thereof
  Randomly Featured Patents
Remote telephone coupler as for medical emergency data transmission
Coupling mechanism
Human calcium channel compositions and methods
Remote client graphics rendering
Antraquinone compositions as anticancer compositions and nutrition supplements and methods of making and using them
Olefins produced from pre-polymerized catalyst component catalysts
Method of coloring porous material
Pultruded member with functional features
Fuel control device for engine having disconnectable groups of cylinders
Method and apparatus for inspecting defect of pattern formed on semiconductor device