Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Semiconductor memory device having test pattern generating circuit










Image Number 2 for United States Patent #4821238.

A semiconductor memory device comprises an internal circuit including a memory circuit; a test pattern generating circuit; an element for receiving external signals supplied from the outside; and an input switching circuit connected between the test pattern generating circuit and the receiving element, for switching the input supplied to the internal circuit between output signals generating from the test pattern generating circuit and the external signals, the output signals generated from the test pattern generated circuit being input to the internal circuit through the input switching circuit in a test mode, the external signals being input to the internal circuit through the input switching circuit in a usual mode; the test pattern generating circuit, the input switching circuit, and the internal circuit being provided on the same chip.








 
 
  Recently Added Patents
Pipette device
Preserving and handling native data in hybrid object trees
System and method for document orientation detection
Method of manufacturing touch panel
Handbag
Stacked thin-film superlattice thermoelectric devices
Global alignment for high-dynamic range image generation
  Randomly Featured Patents
Increasing the life of a supported ruthenium catalyst in the hydrogenation of an olefinically unsaturated dinitrile
Cloverleaf bitless bridle
Shape memory devices and methods for reshaping heart anatomy
Gemstone with 81 facets
High resolution electron beam microfabrication process for fabricating small geometry semiconductor devices
Photometric apparatus for a camera
Electro-optical materials and light modulator devices containing same
Digital memory cell device
Systems to produce an object through solid freeform fabrication
Hydroprocessing of hydrocarbons