Resources Contact Us Home
Semiconductor memory device having test pattern generating circuit

Image Number 2 for United States Patent #4821238.

A semiconductor memory device comprises an internal circuit including a memory circuit; a test pattern generating circuit; an element for receiving external signals supplied from the outside; and an input switching circuit connected between the test pattern generating circuit and the receiving element, for switching the input supplied to the internal circuit between output signals generating from the test pattern generating circuit and the external signals, the output signals generated from the test pattern generated circuit being input to the internal circuit through the input switching circuit in a test mode, the external signals being input to the internal circuit through the input switching circuit in a usual mode; the test pattern generating circuit, the input switching circuit, and the internal circuit being provided on the same chip.

  Recently Added Patents
Advertisement in operating system
DC/DC converter, power supply circuit, and semiconductor device
Measurement of an analyte on the skin using a hue angle
Magnetic impedance element and magnetic sensor using the same
Method for providing information of access point selection
Vibration power generator and vibration power generation device, and communication device and electronic equipment with vibration power generation device
  Randomly Featured Patents
Automatic stationery handling method and apparatus
Bike pedal bearing system
Method of making IC card
Light shield for closing the film slot of a film cartridge
Two-dimensional subband coding equipment
Toiletry kit
Method of treating the colon
Process for manufacturing composite products from lignocellulosic materials
DTV transmitting system and receiving system and method of processing television signal
Heterocyclic topoisomerase poisons