Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Television signal data transmission system










Image Number 3 for United States Patent #4706284.

A television signal data transmission system comprises means for transmitting a television signal in which the phase of the RF carrier is modified during a periodically recurring interval by a SAW filter having a varying phase response between the video and audio carrier frequencies of the signal. The periodically recurring interval is modulated between a first width and a second smaller width respectively representing complementary logic states of a data bit. The first width of the width modulated interval preferably extends between two points respectively located within the non-viewable, overscan portions of the video signal immediately adjacent and on either side of a horizontal blanking interval of the television signal. The transmitted signal is received by a decoder which includes a phase modulation detector for detecting the width modulated intervals and a pulse width discriminator responsive thereto for deriving the data bits.








 
 
  Recently Added Patents
Wind driven generator for vehicles
Sponge
Internal wiring structure of semiconductor device
Use of Lactobacillus for liver protection
Method for releasing a locking in mobile terminal and mobile terminal using the same
Method and device for managing devices in device management system
Trash receptacle
  Randomly Featured Patents
Method and apparatus for reducing input impedance of a preamplifier
Lighting apparatus
Quick opening/closing compression latch
Medical instrument to place a pursestring suture, open a hole and pass a guidewire
Portable monitoring devices and methods of operating same
Water desalting installation through reverse osmosis with pressurized supply tanks in continuous kinetic cycle
Semiconductor memory device
Easy transport seat
Fuel leak sensor system
Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices