Image Number 4 for United States Patent #4632485.
A connector apparatus which is useful in testing electrical circuits where it is desired to mate test equipment to conventional integrated circuit sockets is disclosed. Spring probes make electrical contact with integrated circuit socket pins. J-shaped members of the apparatus have fingers which engage conventional integrated circuit sockets between the socket and a circuit board to clamp the apparatus to the socket. Fasteners lock the apparatus in this clamped position.