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Patent Number Title Of Patent Date Issued
5963826 Method of forming contact hole and multilayered lines structure Oct. 5, 1999
5963825 Method of fabrication of semiconductor fuse with polysilicon plate Oct. 5, 1999
5963824 Method of making a semiconductor device with adjustable threshold voltage Oct. 5, 1999
5963823 Manufacturing method of thin film semiconductor device Oct. 5, 1999
5963822 Method of forming selective epitaxial film Oct. 5, 1999
5963821 Method of making semiconductor wafers Oct. 5, 1999
5963820 Method for forming field oxide or other insulators during the formation of a semiconductor devic... Oct. 5, 1999
5963819 Method of fabricating shallow trench isolation Oct. 5, 1999
5963818 Combined trench isolation and inlaid process for integrated circuit formation Oct. 5, 1999
5963817 Bulk and strained silicon on insulator using local selective oxidation Oct. 5, 1999
5963816 Method for making shallow trench marks Oct. 5, 1999
5963815 Method for forming a surface-roughened conductive film on a semiconductor wafer Oct. 5, 1999
5963814 Method of forming recessed container cells by wet etching conductive layer and dissimilar layer ... Oct. 5, 1999
5963813 Integrated circuitry and method of forming a field effect transistor Oct. 5, 1999
5963812 Manufacturing method of a semiconductor apparatus having an electron donative surface in a side ... Oct. 5, 1999
5963811 Method of fabricating a MOS device with a localized punchthrough stopper Oct. 5, 1999
5963810 Semiconductor device having nitrogen enhanced high permittivity gate insulating layer and fabric... Oct. 5, 1999
5963809 Asymmetrical MOSFET with gate pattern after source/drain formation Oct. 5, 1999
5963808 Method of forming an asymmetric bird's beak cell for a flash EEPROM Oct. 5, 1999
5963807 Silicon carbide field effect transistor with increased avalanche withstand capability Oct. 5, 1999
5963806 Method of forming memory cell with built-in erasure feature Oct. 5, 1999
5963805 Method for forming integrated circuit capacitors including dual layer electrodes Oct. 5, 1999
5963804 Method of making a doped silicon structure with impression image on opposing roughened surfaces Oct. 5, 1999
5963803 Method of making N-channel and P-channel IGFETs with different gate thicknesses and spacer width... Oct. 5, 1999
5963802 CMOS process for forming planarized twin wells Oct. 5, 1999
5963801 Method of forming retrograde well structures and punch-through barriers using low energy implant... Oct. 5, 1999
5963800 CMOS integration process having vertical channel Oct. 5, 1999
5963799 Blanket well counter doping process for high speed/low power MOSFETs Oct. 5, 1999
5963798 Fabrication method of CMOS device having buried implanted layers for lateral isolation (BILLI) Oct. 5, 1999
5963797 Method of manufacturing semiconductor devices Oct. 5, 1999
5963796 Fabrication method for semiconductor package substrate and semiconductor package Oct. 5, 1999
5963795 Method of assembling a heat sink assembly Oct. 5, 1999
5963794 Angularly offset stacked die multichip device and method of manufacture Oct. 5, 1999
5963793 Microelectronic packaging using arched solder columns Oct. 5, 1999
5963792 Use of an oxide surface to facilitate gate break on a carrier substrate for a semiconductor devi... Oct. 5, 1999
5963791 Silicon carbide MOSFET having self-aligned gate structure and method of fabrication Oct. 5, 1999
5963790 Method of producing thin film solar cell Oct. 5, 1999
5963789 Method for silicon island formation Oct. 5, 1999
5963788 Method for integrating microelectromechanical devices with electronic circuitry Oct. 5, 1999
5963787 Method of producing gallium nitride semiconductor light emitting device Oct. 5, 1999
5963786 Method of making semiconductor laser with inverted mesa shaped ridge with cervical surface Oct. 5, 1999
5963785 Dielectrically-isolated integrated circuit Oct. 5, 1999
5963784 Methods of determining parameters of a semiconductor device and the width of an insulative space... Oct. 5, 1999
5963783 In-line detection and assessment of net charge in PECVD silicon dioxide (oxide) layers Oct. 5, 1999
5963782 Semiconductor component and method of manufacture Oct. 5, 1999
5963781 Technique for determining semiconductor substrate thickness Oct. 5, 1999
5963780 Method for detecting defect sizes in polysilicon and source-drain semiconductor devices Oct. 5, 1999
5963779 Integrated circuit using a back gate voltage for burn-in operations Oct. 5, 1999
5963778 Method for producing near net shape planar sputtering targets and an intermediate therefor Oct. 5, 1999
5963777 Hypereutectoid and hypoeutectic binary uranium-vanadium alloys Oct. 5, 1999
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