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Patent Number Title Of Patent Date Issued
5457430 Method and apparatus for reduction of light intensity decay in optical pumping devices Oct. 10, 1995
5457429 Ring oscillator circuit for VCO Oct. 10, 1995
5457428 Method and apparatus for the reduction of time interval error in a phase locked loop circuit Oct. 10, 1995
5457427 High-frequency amplifier means with enhanced output resistance Oct. 10, 1995
5457426 Operational amplifier for low supply voltage applications Oct. 10, 1995
5457425 Input circuit used in apparatus for measuring electric signal Oct. 10, 1995
5457424 Quadrature demodulator operable over different IF frequencies Oct. 10, 1995
5457423 Radio data signal demodulator with clock signal recovery Oct. 10, 1995
5457422 Device for biasing an RF device operating in quasi-linear modes with voltage compensation Oct. 10, 1995
5457421 Voltage stepdown circuit including a voltage divider Oct. 10, 1995
5457420 Inverter circuit and level shifter circuit for providing a high voltage output Oct. 10, 1995
5457419 MOSFET with temperature protection Oct. 10, 1995
5457418 Track and hold circuit with an input transistor held on during hold mode Oct. 10, 1995
5457417 Scaler circuit Oct. 10, 1995
5457416 Electrooptic Q-switching drive circuit for Porro prism laser resonator Oct. 10, 1995
5457415 Charge metering sampling circuit and use thereof in TFT/LCD Oct. 10, 1995
5457414 Power supply loss sensor Oct. 10, 1995
5457413 BiMIS logic circuit Oct. 10, 1995
5457412 Semiconductor integrated circuit device including input circuitry to permit operation of a Bi-CM... Oct. 10, 1995
5457411 Trinary logic input gate Oct. 10, 1995
5457410 Architecture and interconnect scheme for programmable logic circuits Oct. 10, 1995
5457409 Architecture of a multiple array high density programmable logic device with a plurality of prog... Oct. 10, 1995
5457408 Method and apparatus for verifying whether a bitstream received by a field programmable gate arr... Oct. 10, 1995
5457407 Binary weighted reference circuit for a variable impedance output buffer Oct. 10, 1995
5457406 Bidirectional signal transmission circuit and terminator Oct. 10, 1995
5457405 Complementary logic recovered energy circuit Oct. 10, 1995
5457404 Zero-power OR gate Oct. 10, 1995
5457403 Fault tolerant and gate circuit Oct. 10, 1995
5457402 Armature resistance measuring apparatus and method Oct. 10, 1995
5457401 Semiconductor device testing apparatus Oct. 10, 1995
5457400 Semiconductor array having built-in test circuit for wafer level testing Oct. 10, 1995
5457399 Microwave monolithic integrated circuit fabrication, test method and test probes Oct. 10, 1995
5457398 Wafer probe station having full guarding Oct. 10, 1995
5457396 Electrode structure of metallic particle detecting sensor Oct. 10, 1995
5457395 System and apparatus for measuring gaps between non-parallel surfaces Oct. 10, 1995
5457394 Impulse radar studfinder Oct. 10, 1995
5457393 Method and circuit for balancing an error signal Oct. 10, 1995
5457392 Testing clip and circuit board contacting method Oct. 10, 1995
5457391 Load short-circuit detection using AWH-bridge driving circuit and an exclusive-OR gate Oct. 10, 1995
5457390 Circuit board manufacture Oct. 10, 1995
5457389 Method of testing substrate for liquid jet recording head Oct. 10, 1995
5457388 Magnetic resonance apparatus including elements for homogenizing the magnetic field Oct. 10, 1995
5457387 Magnetic resonance imager with removable element RF coil Oct. 10, 1995
5457386 Multiple-coil adopting a quadrature detection method applied thereto and a signal processing cir... Oct. 10, 1995
5457385 NQR methods and apparatus Oct. 10, 1995
5457384 Apparatus and method for attaching a sensor to an object Oct. 10, 1995
5457383 Low power consumption fluxmeter for determining magnetic field strength in three dimensions Oct. 10, 1995
5457382 Apparatus for testing documents having magnetic properties Oct. 10, 1995
5457381 Method for testing the electrical parameters of inputs and outputs of integrated circuits withou... Oct. 10, 1995
5457380 Circuit-test fixture that includes shorted-together probes Oct. 10, 1995
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