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Class Information
Number: ;15/21.1
Name: >

Patents under this class:

Patent Number Title Of Patent Date Issued

  Recently Added Patents
High throughput thin film characterization and defect detection
Protocol delay measuring device and protocol delay measuring method
Face recognition through face building from two or more partial face images from the same face
Generating and modifying textual code interfaces from graphical programs
Audio processing in a multi-participant conference
Generation of interpolated samples for decision based decoding
Methods and apparatus for map detection with reduced complexity
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X-ray tube support column on a mobile x-ray product with improved rotational flexibility
Method of fabricating a semiconductor device using a full silicidation process
Velocity command signal generating apparatus
Microvolume crystallization method employing multiple lumens
Intake device of internal combustion engine
Bearing device and method for measuring axial force
Magnetic angle adjusting arrangement for mirror of motor vehicle
Semiconductor memory device capable of optimizing signal transmission power and power initializing method thereof
Circuit configuration for the generation of a line terminating impedance
Fluid catalyst process with steam injection into catalyst standpipe