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Browse by Category: Main > Material Science
Class Information
Number: 977/881
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With arrangement, process, or apparatus for testing > Microscopy or spectroscopy (e.g., sem, tem, etc.)
Description: Subject matter wherein a microscopy instrument such as an electron microscope or a spectroscopic device is used to measure or test the nanostructure.


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
5510858 Television receiver having an STM memory Apr. 23, 1996
5481529 Scanning probe microscope for observing a sample surface while applying an AC bias voltage between the sample and a probe Jan. 2, 1996
5481521 Information recording and reproducing apparatus utilizing a tunneling current or interatomic forces Jan. 2, 1996
5481522 Recording/reproducing method and apparatus using probe Jan. 2, 1996
5444191 Information processing apparatus and device for use in same Aug. 22, 1995
5432771 Information recording/reproducing apparatus for performing recording/reproduction of information by using probe Jul. 11, 1995
5412980 Tapping atomic force microscope May. 9, 1995
5411744 Silicone vesicles and entrapment May. 2, 1995
5410910 Cryogenic atomic force microscope May. 2, 1995
5402410 High density storage of information on a substrate with multiple depth and height Mar. 28, 1995
5383354 Process for measuring surface topography using atomic force microscopy Jan. 24, 1995
5371727 Scanning tunnel microscopy information processing system with noise detection to correct the tracking mechanism Dec. 6, 1994
5363697 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method Nov. 15, 1994
5357787 Cantilever for atomic force microscope and method of manufacturing the same Oct. 25, 1994
5321685 Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same Jun. 14, 1994
5306918 Installation for the study or the transformation of the surface of samples placed in a vacuum or in a controlled atmosphere Apr. 26, 1994
5299184 Information processing apparatus with held distance control on track edge detection Mar. 29, 1994
5289455 Information recording and/or reproducing apparatus Feb. 22, 1994
5282191 Information reproducing method and information reproducing apparatus which uses the method Jan. 25, 1994
5266897 Magnetic field observation with tunneling microscopy Nov. 30, 1993
5237859 Atomic force microscope Aug. 24, 1993
5220555 Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof Jun. 15, 1993
5214486 Monitor plate for automatic particle detection system May. 25, 1993
5212987 Acoustic screen scan microscope for the examination of an object in the short-range field of a resonant acoustic oscillator May. 25, 1993
5202004 Scanning electrochemical microscopy Apr. 13, 1993
5199021 Method of access to recording medium, and apparatus and method for processing information Mar. 30, 1993
5161147 High speed information system utilizing scanning tunneling microscopy in conjunction with a modulated light source Nov. 3, 1992
5152805 M-I-M' device and fabrication method Oct. 6, 1992
5151594 Subpicosecond atomic and molecular motion detection and signal transmission by field emission Sep. 29, 1992
5134605 Optically readable media utilizing scanning tunneling microscope for excitation Jul. 28, 1992
5091880 Memory device Feb. 25, 1992
5051977 Scanning tunneling microscope memory utilizing optical fluorescence of substrate for reading Sep. 24, 1991
5036490 Memory device with dual cantilever means Jul. 30, 1991
4968390 High resolution deposition and etching in polymer films Nov. 6, 1990
4967825 High resolution replicas Nov. 6, 1990

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