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Class Information
Number: 977/881
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With arrangement, process, or apparatus for testing > Microscopy or spectroscopy (e.g., sem, tem, etc.)
Description: Subject matter wherein a microscopy instrument such as an electron microscope or a spectroscopic device is used to measure or test the nanostructure.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7578176 |
Systems and methods for utilizing scanning probe shape characterization |
Aug. 25, 2009 |
| 7544938 |
Methods and apparatus for statistical characterization of nano-particles |
Jun. 9, 2009 |
| 7511269 |
Method of approaching probe and apparatus for realizing the same |
Mar. 31, 2009 |
| 7485855 |
On-probe sample cleanup system and method for MALDI analysis |
Feb. 3, 2009 |
| 7430898 |
Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique |
Oct. 7, 2008 |
| 7315374 |
Real-time monitoring optically trapped carbon nanotubes |
Jan. 1, 2008 |
| 7268269 |
Multi-functional protective textiles and methods for decontamination |
Sep. 11, 2007 |
| 7181266 |
Materials and methods for near-infrared and infrared lymph node mapping |
Feb. 20, 2007 |
| 6801396 |
Substrate independent superpolishing process and slurry |
Oct. 5, 2004 |
| 6791931 |
Accelerometer using field emitter technology |
Sep. 14, 2004 |
| 6735163 |
Ultra-high density storage device with resonant scanning micromover |
May. 11, 2004 |
| 6700127 |
Point source for producing electrons beams |
Mar. 2, 2004 |
| 6686311 |
Catalyst system for producing carbon fibrils |
Feb. 3, 2004 |
| 6683316 |
Apparatus for correlating an optical image and a SEM image and method of use thereof |
Jan. 27, 2004 |
| 6683451 |
Magnetic resonance force microscope for the study of biological systems |
Jan. 27, 2004 |
| 6677567 |
Scanning probe microscope with improved scan accuracy, scan speed, and optical vision |
Jan. 13, 2004 |
| 6677697 |
Force scanning probe microscope |
Jan. 13, 2004 |
| 6672144 |
Dynamic activation for an atomic force microscope and method of use thereof |
Jan. 6, 2004 |
| 6666075 |
System and method of multi-dimensional force sensing for scanning probe microscopy |
Dec. 23, 2003 |
| 6662623 |
Apparatus and method for glide height calibration of disk surfaces by use of dual-zone laser texture |
Dec. 16, 2003 |
| 6661004 |
Image deconvolution techniques for probe scanning apparatus |
Dec. 9, 2003 |
| 6654118 |
Method and apparatus for obtaining molecular data from a pharmaceutical specimen |
Nov. 25, 2003 |
| 6645824 |
Combined optical profilometry and projection microscopy of integrated circuit structures |
Nov. 11, 2003 |
| 6646113 |
Nucleic acid molecule encoding human survival of motor neuron-interacting protein 1 (SIP1) deletion mutants |
Nov. 11, 2003 |
| 6633174 |
Stepper type test structures and methods for inspection of semiconductor integrated circuits |
Oct. 14, 2003 |
| 6627886 |
Secondary electron spectroscopy method and system |
Sep. 30, 2003 |
| 6622547 |
System and method for facilitating selection of optimized optical proximity correction |
Sep. 23, 2003 |
| 6621114 |
MOS transistors with high-k dielectric gate insulator for reducing remote scattering |
Sep. 16, 2003 |
| 6611087 |
Method and apparatus for simultaneously depositing and observing materials on a target |
Aug. 26, 2003 |
| 6591658 |
Carbon nanotubes as linewidth standards for SEM & AFM |
Jul. 15, 2003 |
| 6583412 |
Scanning tunneling charge transfer microscope |
Jun. 24, 2003 |
| 6570156 |
Autoadjusting electron microscope |
May. 27, 2003 |
| 6562633 |
Assembling arrays of small particles using an atomic force microscope to define ferroelectric domains |
May. 13, 2003 |
| 6555813 |
Probes with hydrophobic coatings for gas phase ion spectrometers |
Apr. 29, 2003 |
| 6531411 |
Surface roughness improvement of SIMOX substrates by controlling orientation of angle of starting material |
Mar. 11, 2003 |
| 6529347 |
Disc drive slider having textured pads |
Mar. 4, 2003 |
| 6528799 |
Device and method for suppressing space charge induced aberrations in charged-particle projection lithography systems |
Mar. 4, 2003 |
| 6522056 |
Method and apparatus for simultaneously depositing and observing materials on a target |
Feb. 18, 2003 |
| 6503701 |
Analytic sensor apparatus and method |
Jan. 7, 2003 |
| 6491425 |
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy |
Dec. 10, 2002 |
| 6489611 |
Atomic force microscope for profiling high aspect ratio samples |
Dec. 3, 2002 |
| 6476275 |
Process for the catalytic selective oxidation of a hydrocarbon compound in presence of mesoporous zeolite |
Nov. 5, 2002 |
| 6476386 |
Method and device for tunnel microscopy |
Nov. 5, 2002 |
| 6448412 |
Methods for the preparation and characterization of multi-substituted fullerenes |
Sep. 10, 2002 |
| 6420703 |
Method for forming a critical dimension SEM calibration standard of improved definition and standard formed |
Jul. 16, 2002 |
| 6414307 |
Method and apparatus for enhancing yield of secondary ions |
Jul. 2, 2002 |
| 6407373 |
Apparatus and method for reviewing defects on an object |
Jun. 18, 2002 |
| 6399785 |
Multiply-substituted fullerenes |
Jun. 4, 2002 |
| 6383286 |
Method of making semiconductor super-atom and aggregate thereof |
May. 7, 2002 |
| 6369385 |
Integrated microcolumn and scanning probe microscope arrays |
Apr. 9, 2002 |
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