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Class Information
Number: 977/879
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe structure > With tip detail > Material
Description: Subject matter wherein the material forming the tip is specified.

Patents under this class:
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Patent Number Title Of Patent Date Issued
8202817 Nanocarbon aggregate and method for manufacturing the same Jun. 19, 2012
7707647 Probe used for surface enhanced vibrational spectroscopic analysis and method of manufacturing the same Apr. 27, 2010
7637960 Short and thin silicon cantilever with tip and fabrication thereof Dec. 29, 2009
7543482 Carbon thin line probe Jun. 9, 2009
7514680 Apparatus for modifying and measuring diamond and other workpiece surfaces with nanoscale precision Apr. 7, 2009
7507958 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip Mar. 24, 2009
7491422 Direct-write nanolithography method of transporting ink with an elastomeric polymer coated nanoscopic tip to form a structure having internal hollows on a substrate Feb. 17, 2009
7485857 Microcoaxial probes made from strained semiconductor bilayers Feb. 3, 2009
7319224 Semiconductor probe with resistive tip and method of fabricating the same Jan. 15, 2008
6817231 Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof Nov. 16, 2004
6797952 Scanning atom probe Sep. 28, 2004
6767696 Scanning tip and process for its production and use, particularly for a scanning probe microscope Jul. 27, 2004
6608306 Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structure Aug. 19, 2003
6504151 Wear coating applied to an atomic force probe tip Jan. 7, 2003
6467333 Trace level detection of analytes using artificial olfactometry Oct. 22, 2002
6339217 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements Jan. 15, 2002
6337477 Probe having micro-projection and manufacturing method thereof Jan. 8, 2002
6291140 Low-cost photoplastic cantilever Sep. 18, 2001
6252226 Nanometer scale data storage device and associated positioning system Jun. 26, 2001
6246054 Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls Jun. 12, 2001
6211685 Surface probe for determining physical properties of a semiconductor device Apr. 3, 2001
6198300 Silicided silicon microtips for scanning probe microscopy Mar. 6, 2001
6121771 Magnetic force microscopy probe with bar magnet tip Sep. 19, 2000
6064201 Method and apparatus to image metallic patches embedded in a non-metal surface May. 16, 2000
6049078 Transmitting tip for scanning tunneling microscopy system Apr. 11, 2000
5986261 Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities Nov. 16, 1999
5976957 Method of making silicon quantum wires on a substrate Nov. 2, 1999
5936243 Conductive micro-probe and memory device Aug. 10, 1999
5892223 Multilayer microtip probe and method Apr. 6, 1999
5877412 Probe for atomic force microscope and atomic force microscope Mar. 2, 1999
5792556 Diamond crystal Aug. 11, 1998
5747120 Laser ablated hard coating for microtools May. 5, 1998
5730940 Scanning probe microscope and molecular processing method using the scanning probe microscope Mar. 24, 1998
5702822 Method for producing single crystal, and needle-like single crystal Dec. 30, 1997
5612491 Formation of a magnetic film on an atomic force microscope cantilever Mar. 18, 1997
5580827 Casting sharpened microminiature tips Dec. 3, 1996
5548117 Probe for a scanning tunneling microscope and method of manufacturing a probe Aug. 20, 1996
5471064 Precision machining method, precision machining apparatus and data storage apparatus using the same Nov. 28, 1995
5469733 Cantilever for atomic force microscope and method of manufacturing the cantilever Nov. 28, 1995
5371365 Scanning probe microscopy Dec. 6, 1994
5357787 Cantilever for atomic force microscope and method of manufacturing the same Oct. 25, 1994
5357109 Probe for scanning tunneling microscope and manufacturing method thereof Oct. 18, 1994
5272913 Cantilever for a scanning probe microscope and a method of manufacturing the same Dec. 28, 1993
5270543 Electronic probe and method for its manufacture Dec. 14, 1993
5245187 Microtip, process for preparation thereof, surface-observing apparatus and information-treating apparatus employing the same Sep. 14, 1993
5214282 Method and apparatus for processing a minute portion of a specimen May. 25, 1993
5193385 Cantilever for use in atomic force microscope and manufacturing method therefor Mar. 16, 1993
5171992 Nanometer scale probe for an atomic force microscope, and method for making same Dec. 15, 1992
5166520 Universal, microfabricated probe for scanning probe microscopes Nov. 24, 1992
5120959 Apparatus for simultaneously effecting electrochemical measurement and measurement of tunneling current and tunnel probe therefor Jun. 9, 1992

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