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Class Information
Number: 977/877
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe structure > With tip detail > Chemically functionalized
Description: Subject matter wherein the tip is chemically modified to react with a certain type of nanostructure.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7604758 |
Process for producing polymer optical waveguide |
Oct. 20, 2009 |
| 7343857 |
Imprint apparatus and method for imprinting |
Mar. 18, 2008 |
| 7344756 |
Method for scanning probe contact printing |
Mar. 18, 2008 |
| 6730905 |
Scanning probe microscopy, method of producing the probe, and molecular processing method using the scanning probe microscope |
May. 4, 2004 |
| 6635311 |
Methods utilizing scanning probe microscope tips and products therefor or products thereby |
Oct. 21, 2003 |
| 6437329 |
Use of carbon nanotubes as chemical sensors by incorporation of fluorescent molecules within the tube |
Aug. 20, 2002 |
| 6252226 |
Nanometer scale data storage device and associated positioning system |
Jun. 26, 2001 |
| 6123817 |
Probe of scanning electrochemical microscope |
Sep. 26, 2000 |
| 5824470 |
Method of preparing probes for sensing and manipulating microscopic environments and structures |
Oct. 20, 1998 |
| 5730940 |
Scanning probe microscope and molecular processing method using the scanning probe microscope |
Mar. 24, 1998 |
| 5548117 |
Probe for a scanning tunneling microscope and method of manufacturing a probe |
Aug. 20, 1996 |
| 5383354 |
Process for measuring surface topography using atomic force microscopy |
Jan. 24, 1995 |
| 5372930 |
Sensor for ultra-low concentration molecular recognition |
Dec. 13, 1994 |
| 5363697 |
Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method |
Nov. 15, 1994 |
| 5353632 |
Probe for atomic force microscope usable for scanning tunneling microscope |
Oct. 11, 1994 |
| 5348638 |
Method of manufacturing a probe for a scanning tunneling microscope |
Sep. 20, 1994 |
| 5214486 |
Monitor plate for automatic particle detection system |
May. 25, 1993 |
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