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Class Information
Number: 977/863
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe structure > Atomic force probe
Description: Subject matter wherein the scanning probe is constructed to operate based upon interaction forces between atoms such as Van der Waals forces between the tip and an object being manufactured, treated, or detected.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7569252 |
Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
Aug. 4, 2009 |
| 7543482 |
Carbon thin line probe |
Jun. 9, 2009 |
| 7491422 |
Direct-write nanolithography method of transporting ink with an elastomeric polymer coated nanoscopic tip to form a structure having internal hollows on a substrate |
Feb. 17, 2009 |
| 7478552 |
Optical detection alignment/tracking method and apparatus |
Jan. 20, 2009 |
| 7442922 |
Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
Oct. 28, 2008 |
| 7430898 |
Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique |
Oct. 7, 2008 |
| 7420106 |
Scanning probe characterization of surfaces |
Sep. 2, 2008 |
| 7402736 |
Method of fabricating a probe having a field effect transistor channel structure |
Jul. 22, 2008 |
| 7095822 |
Near-field X-ray fluorescence microprobe |
Aug. 22, 2006 |
| 7073937 |
Heat emitting probe and heat emitting probe apparatus |
Jul. 11, 2006 |
| 6862923 |
Atomic force microscope |
Mar. 8, 2005 |
| 6850323 |
Locally enhanced raman spectroscopy with an atomic force microscope |
Feb. 1, 2005 |
| 6802549 |
Nanotweezers and nanomanipulator |
Oct. 12, 2004 |
| 6801396 |
Substrate independent superpolishing process and slurry |
Oct. 5, 2004 |
| 6743408 |
Direct growth of nanotubes, and their use in nanotweezers |
Jun. 1, 2004 |
| 6735163 |
Ultra-high density storage device with resonant scanning micromover |
May. 11, 2004 |
| 6735046 |
Nano-magnetic head and nano-magnetic head device using the same |
May. 11, 2004 |
| 6716409 |
Fabrication of nanotube microscopy tips |
Apr. 6, 2004 |
| 6684686 |
Non-contact type atomic microscope and observation method using it |
Feb. 3, 2004 |
| 6677697 |
Force scanning probe microscope |
Jan. 13, 2004 |
| 6672144 |
Dynamic activation for an atomic force microscope and method of use thereof |
Jan. 6, 2004 |
| 6665258 |
Method and apparatus for recording, storing and reproducing information |
Dec. 16, 2003 |
| 6661004 |
Image deconvolution techniques for probe scanning apparatus |
Dec. 9, 2003 |
| 6652413 |
Traction drive rotary assembly |
Nov. 25, 2003 |
| 6653630 |
Tailoring domain engineered structures in ferroelectric materials |
Nov. 25, 2003 |
| 6649902 |
Summing the output of an array of optical detector segments in an atomic force microscope |
Nov. 18, 2003 |
| 6622547 |
System and method for facilitating selection of optimized optical proximity correction |
Sep. 23, 2003 |
| 6597639 |
Assembly suitable for writing high density data on a ferroelectric media |
Jul. 22, 2003 |
| 6591658 |
Carbon nanotubes as linewidth standards for SEM & AFM |
Jul. 15, 2003 |
| 6562633 |
Assembling arrays of small particles using an atomic force microscope to define ferroelectric domains |
May. 13, 2003 |
| 6554756 |
Method for manufacturing radioactive brachytherapy source material, brachytherapy source material and encapsulated radioactive brachytherapy source |
Apr. 29, 2003 |
| 6545492 |
Multiple local probe measuring device and method |
Apr. 8, 2003 |
| 6530266 |
Active probe for an atomic force microscope and method of use thereof |
Mar. 11, 2003 |
| 6531411 |
Surface roughness improvement of SIMOX substrates by controlling orientation of angle of starting material |
Mar. 11, 2003 |
| 6529347 |
Disc drive slider having textured pads |
Mar. 4, 2003 |
| 6518570 |
Sensing mode atomic force microscope |
Feb. 11, 2003 |
| 6499340 |
Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope |
Dec. 31, 2002 |
| 6457350 |
Carbon nanotube probe tip grown on a small probe |
Oct. 1, 2002 |
| 6455847 |
Carbon nanotube probes in atomic force microscope to detect partially open/closed contacts |
Sep. 24, 2002 |
| 6455838 |
High sensitivity deflection sensing device |
Sep. 24, 2002 |
| 6437328 |
Hyperbaric hydrothermal atomic force microscope |
Aug. 20, 2002 |
| 6401526 |
Carbon nanotubes and methods of fabrication thereof using a liquid phase catalyst precursor |
Jun. 11, 2002 |
| 6349591 |
Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation |
Feb. 26, 2002 |
| 6313905 |
Apparatus and method for defining a pattern on a substrate |
Nov. 6, 2001 |
| 6296552 |
Burnishing head with fly height control spacer |
Oct. 2, 2001 |
| 6292316 |
Detection and characterization of defects on surfaces of magnetic disks |
Sep. 18, 2001 |
| 6265711 |
Scanning probe microscope assembly and method for making spectrophotometric near-field optical and scanning measurements |
Jul. 24, 2001 |
| 6244103 |
Interpolated height determination in an atomic force microscope |
Jun. 12, 2001 |
| 6233206 |
High density magnetic thermal recording and reproducing assembly |
May. 15, 2001 |
| 6229609 |
Scanning near-field optic/atomic force microscope |
May. 8, 2001 |
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