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Class Information
Number: 977/860
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe structure
Description: Subject matter including structural details of the scanning probe.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7621964 |
Near-field scanning optical microscope probe having a light emitting diode |
Nov. 24, 2009 |
| 7597717 |
Rotatable multi-cantilever scanning probe microscopy head |
Oct. 6, 2009 |
| 7578853 |
Scanning probe microscope system |
Aug. 25, 2009 |
| 7543482 |
Carbon thin line probe |
Jun. 9, 2009 |
| 7507957 |
Probe microscope system suitable for observing sample of long body |
Mar. 24, 2009 |
| 7478552 |
Optical detection alignment/tracking method and apparatus |
Jan. 20, 2009 |
| 7459682 |
Spin-polarized electron source and spin-polarized scanning tunneling microscope |
Dec. 2, 2008 |
| 7456400 |
Scanning probe microscope and scanning method |
Nov. 25, 2008 |
| 7444856 |
Sensors for electrochemical, electrical or topographical analysis |
Nov. 4, 2008 |
| 7442922 |
Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
Oct. 28, 2008 |
| 7427754 |
Telegraph signal microscopy device and method |
Sep. 23, 2008 |
| 7420106 |
Scanning probe characterization of surfaces |
Sep. 2, 2008 |
| 7402736 |
Method of fabricating a probe having a field effect transistor channel structure |
Jul. 22, 2008 |
| 7344756 |
Method for scanning probe contact printing |
Mar. 18, 2008 |
| 7075071 |
Conductive transparent probe and probe control apparatus |
Jul. 11, 2006 |
| 7011884 |
Carbon nanotube with a graphitic outer layer |
Mar. 14, 2006 |
| 6880388 |
Active cantilever for nanomachining and metrology |
Apr. 19, 2005 |
| 6810721 |
Submerged sample observation apparatus and method |
Nov. 2, 2004 |
| 6776031 |
Submerged sample observation apparatus and method |
Aug. 17, 2004 |
| 6734438 |
Scanning probe microscope and solenoid driven cantilever assembly |
May. 11, 2004 |
| 6710339 |
Scanning probe microscope |
Mar. 23, 2004 |
| 6684686 |
Non-contact type atomic microscope and observation method using it |
Feb. 3, 2004 |
| 6683316 |
Apparatus for correlating an optical image and a SEM image and method of use thereof |
Jan. 27, 2004 |
| 6672144 |
Dynamic activation for an atomic force microscope and method of use thereof |
Jan. 6, 2004 |
| 6666075 |
System and method of multi-dimensional force sensing for scanning probe microscopy |
Dec. 23, 2003 |
| 6664061 |
Use and evaluation of a [2+2] photoaddition in immobilization of oligonucleotides on a three-dimensional hydrogel matrix |
Dec. 16, 2003 |
| 6633174 |
Stepper type test structures and methods for inspection of semiconductor integrated circuits |
Oct. 14, 2003 |
| 6608307 |
System and method for accurate positioning of a scanning probe microscope |
Aug. 19, 2003 |
| 6591658 |
Carbon nanotubes as linewidth standards for SEM & AFM |
Jul. 15, 2003 |
| 6583412 |
Scanning tunneling charge transfer microscope |
Jun. 24, 2003 |
| 6582673 |
Carbon nanotube with a graphitic outer layer: process and application |
Jun. 24, 2003 |
| 6532806 |
Scanning evanescent electro-magnetic microscope |
Mar. 18, 2003 |
| 6528807 |
Method for applying or removing material |
Mar. 4, 2003 |
| 6479980 |
Thin film spin probe |
Nov. 12, 2002 |
| 6426499 |
Multi-probe test head and process using same |
Jul. 30, 2002 |
| 6415653 |
Cantilever for use in a scanning probe microscope |
Jul. 9, 2002 |
| 6369385 |
Integrated microcolumn and scanning probe microscope arrays |
Apr. 9, 2002 |
| 6356524 |
Method of recording/reproducing an information signal |
Mar. 12, 2002 |
| 6291927 |
Micromachined two dimensional array of piezoelectrically actuated flextensional transducers |
Sep. 18, 2001 |
| 6279389 |
AFM with referenced or differential height measurement |
Aug. 28, 2001 |
| 6246054 |
Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls |
Jun. 12, 2001 |
| 6242737 |
Microscopic system equipt with an electron microscope and a scanning probe microscope |
Jun. 5, 2001 |
| 6211673 |
Apparatus for use in magnetic-field detection and generation devices |
Apr. 3, 2001 |
| 6211685 |
Surface probe for determining physical properties of a semiconductor device |
Apr. 3, 2001 |
| 6200022 |
Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy |
Mar. 13, 2001 |
| 6184519 |
Surface analyzing apparatus with anti-vibration table |
Feb. 6, 2001 |
| 6159742 |
Nanometer-scale microscopy probes |
Dec. 12, 2000 |
| 6134955 |
Magnetic modulation of force sensor for AC detection in an atomic force microscope |
Oct. 24, 2000 |
| 6127682 |
Scanning probe microscope and method of analyzing sample using same |
Oct. 3, 2000 |
| 6095679 |
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy |
Aug. 1, 2000 |
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