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Class Information
Number: 977/852
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > For detection of specific nanostructure sample or nanostructure-related property
Description: Subject matter wherein the scanning probe is used to detect a particular sample or to measure a particular nanoscale property of the sample, e.g., shape resistivity, charge density, etc.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7456400 |
Scanning probe microscope and scanning method |
Nov. 25, 2008 |
| 7420106 |
Scanning probe characterization of surfaces |
Sep. 2, 2008 |
| 7384795 |
Methods for verifying fluid movement |
Jun. 10, 2008 |
| 7361893 |
In situ scanning tunneling microscope tip treatment device for spin polarization imaging |
Apr. 22, 2008 |
| 6989535 |
Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium |
Jan. 24, 2006 |
| 6987277 |
Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces |
Jan. 17, 2006 |
| 6981407 |
Atomic force microscopy measurements of contact resistance and current-dependent stiction |
Jan. 3, 2006 |
| 6952952 |
Topography and recognition imaging atomic force microscope and method of operation |
Oct. 11, 2005 |
| 6927569 |
Techniques for electrically characterizing tunnel junction film stacks with little or no processing |
Aug. 9, 2005 |
| 6912894 |
Atomic force microscopy measurements of contact resistance and current-dependent stiction |
Jul. 5, 2005 |
| 6904791 |
Scanning probe microscope |
Jun. 14, 2005 |
| 6877365 |
Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
Apr. 12, 2005 |
| 6875981 |
Scanning atom probe and analysis method utilizing scanning atom probe |
Apr. 5, 2005 |
| 6873163 |
Spatially resolved electromagnetic property measurement |
Mar. 29, 2005 |
| 6871559 |
Atomic force microscopy measurements of contact resistance and current-dependent stiction |
Mar. 29, 2005 |
| 6864483 |
Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device |
Mar. 8, 2005 |
| 6823713 |
Scanning tip orientation adjustment method for atomic force microscopy |
Nov. 30, 2004 |
| 6823724 |
Method and apparatus for measuring values of physical property |
Nov. 30, 2004 |
| 6818891 |
Sensing mode atomic force microscope |
Nov. 16, 2004 |
| 6791081 |
Method for determining pore characteristics in porous materials |
Sep. 14, 2004 |
| 6780075 |
Method of fabricating nano-tube, method of manufacturing field-emission type cold cathode, and method of manufacturing display device |
Aug. 24, 2004 |
| 6755075 |
Ultra micro indentation testing apparatus |
Jun. 29, 2004 |
| 6752008 |
Method and apparatus for scanning in scanning probe microscopy and presenting results |
Jun. 22, 2004 |
| 6737646 |
Enhanced scanning probe microscope and nanolithographic methods using the same |
May. 18, 2004 |
| 6714892 |
Three dimensional reconstruction metrology |
Mar. 30, 2004 |
| 6622547 |
System and method for facilitating selection of optimized optical proximity correction |
Sep. 23, 2003 |
| 6612161 |
Atomic force microscopy measurements of contact resistance and current-dependent stiction |
Sep. 2, 2003 |
| 6605941 |
Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes |
Aug. 12, 2003 |
| 6597185 |
Apparatus for localized measurements of complex permittivity of a material |
Jul. 22, 2003 |
| 6566653 |
Investigation device and method |
May. 20, 2003 |
| 6552337 |
Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements |
Apr. 22, 2003 |
| 6552339 |
Micro goniometer for scanning probe microscopy |
Apr. 22, 2003 |
| 6552554 |
Testing current perpendicular to plane giant magnetoresistance multilayer devices |
Apr. 22, 2003 |
| 6546788 |
Nanotomography |
Apr. 15, 2003 |
| 6532805 |
Micro-material testing apparatus |
Mar. 18, 2003 |
| 6507197 |
Electrostatic force detector with cantilever for an electrostatic force microscope |
Jan. 14, 2003 |
| 6499340 |
Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope |
Dec. 31, 2002 |
| 6498502 |
Apparatus and method for evaluating semiconductor structures and devices |
Dec. 24, 2002 |
| 6491425 |
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy |
Dec. 10, 2002 |
| 6487515 |
Method and apparatus for measuring thermal and electrical properties of thermoelectric materials |
Nov. 26, 2002 |
| 6467951 |
Probe apparatus and method for measuring thermoelectric properties of materials |
Oct. 22, 2002 |
| 6466039 |
Ferroelectric film property measuring device, measuring method therefor and measuring method for semiconductor memory units |
Oct. 15, 2002 |
| 6457349 |
Method of testing hardness of micro region |
Oct. 1, 2002 |
| 6455847 |
Carbon nanotube probes in atomic force microscope to detect partially open/closed contacts |
Sep. 24, 2002 |
| 6452170 |
Scanning force microscope to determine interaction forces with high-frequency cantilever |
Sep. 17, 2002 |
| 6437329 |
Use of carbon nanotubes as chemical sensors by incorporation of fluorescent molecules within the tube |
Aug. 20, 2002 |
| 6427345 |
Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surface |
Aug. 6, 2002 |
| 6405137 |
Method and apparatus for performing chemical analysis using imaging by scanning thermal microscopy |
Jun. 11, 2002 |
| 6404207 |
Scanning capacitance device for film thickness mapping featuring enhanced lateral resolution, measurement methods using same |
Jun. 11, 2002 |
| 6349594 |
Method of measuring film thickness distribution |
Feb. 26, 2002 |
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