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Class Information
Number: 977/851
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe control process > Particular movement or positioning of scanning tip
Description: Subject matter including specified details of the movement or positioning of the scanning probe tip relative to the object being detected or processed (e.g. tapping mode, non-contact, positioning feedback control, etc.).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7578853 |
Scanning probe microscope system |
Aug. 25, 2009 |
| 7569817 |
Scanning probe apparatus |
Aug. 4, 2009 |
| 7541062 |
Thermal control of deposition in dip pen nanolithography |
Jun. 2, 2009 |
| 7511269 |
Method of approaching probe and apparatus for realizing the same |
Mar. 31, 2009 |
| 7491425 |
Scanning probe-based lithography method |
Feb. 17, 2009 |
| 7456400 |
Scanning probe microscope and scanning method |
Nov. 25, 2008 |
| 7452432 |
Apparatus for and method of bonding nano-tip using electrochemical etching |
Nov. 18, 2008 |
| 7430898 |
Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique |
Oct. 7, 2008 |
| 7429732 |
Scanning probe microscopy method and apparatus utilizing sample pitch |
Sep. 30, 2008 |
| 7358490 |
Methods and apparatus of spatially resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy |
Apr. 15, 2008 |
| 7323657 |
Precision machining method using a near-field scanning optical microscope |
Jan. 29, 2008 |
| 7198961 |
Method for modifying existing micro-and nano-structures using a near-field scanning optical microscope |
Apr. 3, 2007 |
| 6931917 |
System for sensing a sample |
Aug. 23, 2005 |
| 6888135 |
Scanning probe microscope with probe formed by single conductive material |
May. 3, 2005 |
| 6881954 |
Scanning probe microscope and method of measurement |
Apr. 19, 2005 |
| 6823713 |
Scanning tip orientation adjustment method for atomic force microscopy |
Nov. 30, 2004 |
| 6818891 |
Sensing mode atomic force microscope |
Nov. 16, 2004 |
| 6812460 |
Nano-manipulation by gyration |
Nov. 2, 2004 |
| 6752008 |
Method and apparatus for scanning in scanning probe microscopy and presenting results |
Jun. 22, 2004 |
| 6745617 |
Scanning probe microscope |
Jun. 8, 2004 |
| 6740876 |
Scanning probe microscope |
May. 25, 2004 |
| 6715346 |
Atomic force microscopy scanning methods |
Apr. 6, 2004 |
| 6710339 |
Scanning probe microscope |
Mar. 23, 2004 |
| 6703614 |
Method for determining the distance of a near-field probe from a specimen surface to be examined, and near-field microscope |
Mar. 9, 2004 |
| 6666075 |
System and method of multi-dimensional force sensing for scanning probe microscopy |
Dec. 23, 2003 |
| 6608307 |
System and method for accurate positioning of a scanning probe microscope |
Aug. 19, 2003 |
| 6596992 |
Method of operating scanning probe microscope |
Jul. 22, 2003 |
| 6571612 |
Probe scanning method |
Jun. 3, 2003 |
| 6530266 |
Active probe for an atomic force microscope and method of use thereof |
Mar. 11, 2003 |
| 6520005 |
System for sensing a sample |
Feb. 18, 2003 |
| 6518570 |
Sensing mode atomic force microscope |
Feb. 11, 2003 |
| 6508110 |
Atomic force microscope |
Jan. 21, 2003 |
| 6499340 |
Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope |
Dec. 31, 2002 |
| 6489611 |
Atomic force microscope for profiling high aspect ratio samples |
Dec. 3, 2002 |
| 6470738 |
Rotating probe microscope |
Oct. 29, 2002 |
| 6441371 |
Scanning probe microscope |
Aug. 27, 2002 |
| 6425189 |
Probe tip locator having improved marker arrangement for reduced bit encoding error |
Jul. 30, 2002 |
| 6323483 |
High bandwidth recoiless microactuator |
Nov. 27, 2001 |
| 6308557 |
Device scanning in a raster mode, with compensation of disturbing effects of mechanical vibrations on the scanning process |
Oct. 30, 2001 |
| 6297502 |
Method and apparatus for force control of a scanning probe |
Oct. 2, 2001 |
| 6288391 |
Method for locking probe of scanning probe microscope |
Sep. 11, 2001 |
| 6265718 |
Scanning probe microscope with scan correction |
Jul. 24, 2001 |
| 6244103 |
Interpolated height determination in an atomic force microscope |
Jun. 12, 2001 |
| 6223591 |
Probe needle arrangement and movement method for use in an atomic force microscope |
May. 1, 2001 |
| 6215121 |
Three-dimensional scanning probe microscope |
Apr. 10, 2001 |
| 6189374 |
Active probe for an atomic force microscope and method of use thereof |
Feb. 20, 2001 |
| 6185991 |
Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode |
Feb. 13, 2001 |
| 6178653 |
Probe tip locator |
Jan. 30, 2001 |
| 6181097 |
High precision three-dimensional alignment system for lithography, fabrication and inspection |
Jan. 30, 2001 |
| 6172506 |
Capacitance atomic force microscopes and methods of operating such microscopes |
Jan. 9, 2001 |
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