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Class Information
Number: 977/851
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe control process > Particular movement or positioning of scanning tip
Description: Subject matter including specified details of the movement or positioning of the scanning probe tip relative to the object being detected or processed (e.g. tapping mode, non-contact, positioning feedback control, etc.).

Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
8438661 Scanning probe microscope May. 7, 2013
8347409 Resonance compensation in scanning probe microscopy Jan. 1, 2013
8341760 Scanning probe microscope Dec. 25, 2012
8296860 Atomic force microscopy true shape measurement method Oct. 23, 2012
8261662 Active pen nanolithography Sep. 11, 2012
8209766 Scanning probe microscope capable of measuring samples having overhang structure Jun. 26, 2012
7998528 Method for direct fabrication of nanostructures Aug. 16, 2011
7954165 Scanning probe microscope May. 31, 2011
7904966 Scanning probe microscope apparatus Mar. 8, 2011
7877816 Scanning probe in pulsed-force mode, digital and in real time Jan. 25, 2011
7862858 Scanning probe-based lithography method Jan. 4, 2011
7735358 Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly Jun. 15, 2010
7644447 Scanning probe microscope capable of measuring samples having overhang structure Jan. 5, 2010
7578853 Scanning probe microscope system Aug. 25, 2009
7569817 Scanning probe apparatus Aug. 4, 2009
7541062 Thermal control of deposition in dip pen nanolithography Jun. 2, 2009
7511269 Method of approaching probe and apparatus for realizing the same Mar. 31, 2009
7491425 Scanning probe-based lithography method Feb. 17, 2009
7456400 Scanning probe microscope and scanning method Nov. 25, 2008
7452432 Apparatus for and method of bonding nano-tip using electrochemical etching Nov. 18, 2008
7430898 Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique Oct. 7, 2008
7429732 Scanning probe microscopy method and apparatus utilizing sample pitch Sep. 30, 2008
7358490 Methods and apparatus of spatially resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy Apr. 15, 2008
7323657 Precision machining method using a near-field scanning optical microscope Jan. 29, 2008
7198961 Method for modifying existing micro-and nano-structures using a near-field scanning optical microscope Apr. 3, 2007
6931917 System for sensing a sample Aug. 23, 2005
6888135 Scanning probe microscope with probe formed by single conductive material May. 3, 2005
6881954 Scanning probe microscope and method of measurement Apr. 19, 2005
6823713 Scanning tip orientation adjustment method for atomic force microscopy Nov. 30, 2004
6818891 Sensing mode atomic force microscope Nov. 16, 2004
6812460 Nano-manipulation by gyration Nov. 2, 2004
6752008 Method and apparatus for scanning in scanning probe microscopy and presenting results Jun. 22, 2004
6745617 Scanning probe microscope Jun. 8, 2004
6740876 Scanning probe microscope May. 25, 2004
6715346 Atomic force microscopy scanning methods Apr. 6, 2004
6710339 Scanning probe microscope Mar. 23, 2004
6703614 Method for determining the distance of a near-field probe from a specimen surface to be examined, and near-field microscope Mar. 9, 2004
6666075 System and method of multi-dimensional force sensing for scanning probe microscopy Dec. 23, 2003
6608307 System and method for accurate positioning of a scanning probe microscope Aug. 19, 2003
6596992 Method of operating scanning probe microscope Jul. 22, 2003
6571612 Probe scanning method Jun. 3, 2003
6530266 Active probe for an atomic force microscope and method of use thereof Mar. 11, 2003
6520005 System for sensing a sample Feb. 18, 2003
6518570 Sensing mode atomic force microscope Feb. 11, 2003
6508110 Atomic force microscope Jan. 21, 2003
6499340 Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope Dec. 31, 2002
6489611 Atomic force microscope for profiling high aspect ratio samples Dec. 3, 2002
6470738 Rotating probe microscope Oct. 29, 2002
6441371 Scanning probe microscope Aug. 27, 2002
6425189 Probe tip locator having improved marker arrangement for reduced bit encoding error Jul. 30, 2002

1 2 3 4

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