| |
 |
|
Class Information
Number: 977/850
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe > Scanning probe control process
Description: Subject matter including a control method of using a scanning probe in manufacture, treatment, or detection of nanostructures.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7569817 |
Scanning probe apparatus |
Aug. 4, 2009 |
| 7491425 |
Scanning probe-based lithography method |
Feb. 17, 2009 |
| 7478552 |
Optical detection alignment/tracking method and apparatus |
Jan. 20, 2009 |
| 7435955 |
Scanning probe microscope control system |
Oct. 14, 2008 |
| 7429732 |
Scanning probe microscopy method and apparatus utilizing sample pitch |
Sep. 30, 2008 |
| 7402736 |
Method of fabricating a probe having a field effect transistor channel structure |
Jul. 22, 2008 |
| 7207119 |
Controller |
Apr. 24, 2007 |
| 7161286 |
Carbon nanotube array and method for making same |
Jan. 9, 2007 |
| 7002149 |
Delay time modulation femtosecond time-resolved scanning probe microscope apparatus |
Feb. 21, 2006 |
| 6993959 |
System and method for the analysis of atomic force microscopy data |
Feb. 7, 2006 |
| 6987277 |
Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces |
Jan. 17, 2006 |
| 6983644 |
Specimen observation method in atomic force microscopy and atomic force microscope |
Jan. 10, 2006 |
| 6978654 |
Scanning tip orientation adjustment method for atomic force microscopy |
Dec. 27, 2005 |
| 6951130 |
Software synchronization of multiple scanning probes |
Oct. 4, 2005 |
| 6941798 |
Scanning probe microscope and operation method |
Sep. 13, 2005 |
| 6906450 |
Resonant probe driving arrangement and a scanning probe microscope including such an arrangement |
Jun. 14, 2005 |
| 6880389 |
Software synchronization of multiple scanning probes |
Apr. 19, 2005 |
| 6862924 |
Augmenting reality system for real-time nanomanipulation using atomic force microscopy |
Mar. 8, 2005 |
| 6845655 |
Heterodyne feedback system for scanning force microscopy and the like |
Jan. 25, 2005 |
| 6838889 |
Method and apparatus for reducing the parachuting of a probe |
Jan. 4, 2005 |
| 6835925 |
Signal detector and probe microscope using the same |
Dec. 28, 2004 |
| 6823724 |
Method and apparatus for measuring values of physical property |
Nov. 30, 2004 |
| 6823723 |
Method and apparatus for performing atomic force microscopy measurements |
Nov. 30, 2004 |
| 6810354 |
Image reconstruction method |
Oct. 26, 2004 |
| 6793670 |
Multi-modal system for detection and control of changes in brain state |
Sep. 21, 2004 |
| 6774692 |
Apparatus and method for providing square wave to atomic force microscope |
Aug. 10, 2004 |
| 6720553 |
Tip calibration standard and method for tip calibration |
Apr. 13, 2004 |
| 6718209 |
Retinal prosthesis with remote return electrode |
Apr. 6, 2004 |
| 6710339 |
Scanning probe microscope |
Mar. 23, 2004 |
| 6701267 |
Method for calibrating probe and computer-readable medium |
Mar. 2, 2004 |
| 6701268 |
Method for calibrating scanning probe and computer-readable medium therefor |
Mar. 2, 2004 |
| 6695885 |
Method and apparatus for coupling an implantable stimulator/sensor to a prosthetic device |
Feb. 24, 2004 |
| 6677697 |
Force scanning probe microscope |
Jan. 13, 2004 |
| 6672144 |
Dynamic activation for an atomic force microscope and method of use thereof |
Jan. 6, 2004 |
| 6661004 |
Image deconvolution techniques for probe scanning apparatus |
Dec. 9, 2003 |
| 6633174 |
Stepper type test structures and methods for inspection of semiconductor integrated circuits |
Oct. 14, 2003 |
| 6624627 |
Method for indexing magnetic disks by using a scanning probe |
Sep. 23, 2003 |
| 6608307 |
System and method for accurate positioning of a scanning probe microscope |
Aug. 19, 2003 |
| 6600312 |
Method and apparatus for indexing hard disks by using a scanning probe |
Jul. 29, 2003 |
| 6448553 |
Signal detector to be used with scanning probe and atomic force microscope |
Sep. 10, 2002 |
| 6405137 |
Method and apparatus for performing chemical analysis using imaging by scanning thermal microscopy |
Jun. 11, 2002 |
| 6389886 |
Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample |
May. 21, 2002 |
| 6369397 |
SPM base focal plane positioning |
Apr. 9, 2002 |
| 6354133 |
Use of carbon nanotubes to calibrate conventional tips used in AFM |
Mar. 12, 2002 |
| 6353221 |
Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument |
Mar. 5, 2002 |
| 6305226 |
Method and apparatus for imaging acoustic fields in high-frequency acoustic resonators |
Oct. 23, 2001 |
| 6265718 |
Scanning probe microscope with scan correction |
Jul. 24, 2001 |
| 6242736 |
Scanning probe microscope |
Jun. 5, 2001 |
| 6229138 |
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
May. 8, 2001 |
| 6185992 |
Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample |
Feb. 13, 2001 |
|
|
|
