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Class Information
Number: 977/849
Name: Nanotechnology > Manufacture, treatment, or detection of nanostructure > With scanning probe
Description: Subject matter including a device having at least a tip of nanometer sized dimensions capable of performing manufacture, treatment, or detection in the nanometer range, e.g., scanning tunneling microscope (STM), atomic force microscope (AFM), magnetic force microscope (MFM), and near-field optical scanning probe etc.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7621964 |
Near-field scanning optical microscope probe having a light emitting diode |
Nov. 24, 2009 |
| 7597717 |
Rotatable multi-cantilever scanning probe microscopy head |
Oct. 6, 2009 |
| 7578853 |
Scanning probe microscope system |
Aug. 25, 2009 |
| 7569817 |
Scanning probe apparatus |
Aug. 4, 2009 |
| 7544938 |
Methods and apparatus for statistical characterization of nano-particles |
Jun. 9, 2009 |
| 7541062 |
Thermal control of deposition in dip pen nanolithography |
Jun. 2, 2009 |
| 7491425 |
Scanning probe-based lithography method |
Feb. 17, 2009 |
| 7478552 |
Optical detection alignment/tracking method and apparatus |
Jan. 20, 2009 |
| 7459682 |
Spin-polarized electron source and spin-polarized scanning tunneling microscope |
Dec. 2, 2008 |
| 7456400 |
Scanning probe microscope and scanning method |
Nov. 25, 2008 |
| 7442922 |
Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
Oct. 28, 2008 |
| 7429732 |
Scanning probe microscopy method and apparatus utilizing sample pitch |
Sep. 30, 2008 |
| 7427754 |
Telegraph signal microscopy device and method |
Sep. 23, 2008 |
| 7422696 |
Multicomponent nanorods |
Sep. 9, 2008 |
| 7420106 |
Scanning probe characterization of surfaces |
Sep. 2, 2008 |
| 7402736 |
Method of fabricating a probe having a field effect transistor channel structure |
Jul. 22, 2008 |
| 7395727 |
Strain detection for automated nano-manipulation |
Jul. 8, 2008 |
| 7361893 |
In situ scanning tunneling microscope tip treatment device for spin polarization imaging |
Apr. 22, 2008 |
| 7261352 |
Electrostatically driven carbon nanotube gripping device |
Aug. 28, 2007 |
| 7241987 |
Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe |
Jul. 10, 2007 |
| 6998689 |
Fluid delivery for scanning probe microscopy |
Feb. 14, 2006 |
| 6987277 |
Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces |
Jan. 17, 2006 |
| 6986876 |
Method for forming composites of sub-arrays of single-wall carbon nanotubes |
Jan. 17, 2006 |
| 6791931 |
Accelerometer using field emitter technology |
Sep. 14, 2004 |
| 6735163 |
Ultra-high density storage device with resonant scanning micromover |
May. 11, 2004 |
| 6719756 |
Electrode catheter with reduced noise activity as well as a related processing method for the electrode surface |
Apr. 13, 2004 |
| 6677567 |
Scanning probe microscope with improved scan accuracy, scan speed, and optical vision |
Jan. 13, 2004 |
| 6608307 |
System and method for accurate positioning of a scanning probe microscope |
Aug. 19, 2003 |
| 6588208 |
Wireless technique for microactivation |
Jul. 8, 2003 |
| 6582583 |
Amperometric biomimetic enzyme sensors based on modified cyclodextrin as electrocatalysts |
Jun. 24, 2003 |
| 6566885 |
Multiple directional scans of test structures on semiconductor integrated circuits |
May. 20, 2003 |
| 6566897 |
Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam |
May. 20, 2003 |
| 6514768 |
Replicable probe array |
Feb. 4, 2003 |
| 6426499 |
Multi-probe test head and process using same |
Jul. 30, 2002 |
| 6423967 |
Detection apparatus and detection method to be used for scanning probe and observation apparatus and observation method |
Jul. 23, 2002 |
| 6415653 |
Cantilever for use in a scanning probe microscope |
Jul. 9, 2002 |
| 6369385 |
Integrated microcolumn and scanning probe microscope arrays |
Apr. 9, 2002 |
| 6354133 |
Use of carbon nanotubes to calibrate conventional tips used in AFM |
Mar. 12, 2002 |
| 6320200 |
Sub-nanoscale electronic devices and processes |
Nov. 20, 2001 |
| 6310342 |
Optical microscope stage for scanning probe microscope |
Oct. 30, 2001 |
| 6305226 |
Method and apparatus for imaging acoustic fields in high-frequency acoustic resonators |
Oct. 23, 2001 |
| 6282907 |
Thermoelectric cooling apparatus and method for maximizing energy transport |
Sep. 4, 2001 |
| 6279389 |
AFM with referenced or differential height measurement |
Aug. 28, 2001 |
| 6267005 |
Dual stage instrument for scanning a specimen |
Jul. 31, 2001 |
| 6256996 |
Nanoscopic thermoelectric coolers |
Jul. 10, 2001 |
| 6244103 |
Interpolated height determination in an atomic force microscope |
Jun. 12, 2001 |
| 6228498 |
Structured body of carbon having frustum protrusion and method for the preparation thereof |
May. 8, 2001 |
| 6211673 |
Apparatus for use in magnetic-field detection and generation devices |
Apr. 3, 2001 |
| 6211685 |
Surface probe for determining physical properties of a semiconductor device |
Apr. 3, 2001 |
| 6200022 |
Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy |
Mar. 13, 2001 |
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