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Class Information
Number: 73/105
Name: Measuring and testing > Surface and cutting edge testing > Roughness
Description: Subject matter for testing of surfaces for roughness.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7618465 |
Near-field antenna |
Nov. 17, 2009 |
| 7617720 |
Surface position measuring method and surface position measuring device |
Nov. 17, 2009 |
| 7617719 |
Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging |
Nov. 17, 2009 |
| 7615739 |
Spin microscope based on optically detected magnetic resonance |
Nov. 10, 2009 |
| 7615738 |
Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
Nov. 10, 2009 |
| 7614288 |
Scanning probe microscope fine-movement mechanism and scanning probe microscope using same |
Nov. 10, 2009 |
| 7614287 |
Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
Nov. 10, 2009 |
| 7610797 |
Carbon nanotube detection system |
Nov. 3, 2009 |
| 7608820 |
Spin microscope based on optically detected magnetic resonance |
Oct. 27, 2009 |
| 7607344 |
Factory-alignable compact cantilever probe |
Oct. 27, 2009 |
| 7607343 |
System for nano position sensing in scanning probe microscopes using an estimator |
Oct. 27, 2009 |
| 7607342 |
Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument |
Oct. 27, 2009 |
| 7605368 |
Vibration-type cantilever holder and scanning probe microscope |
Oct. 20, 2009 |
| 7603891 |
Multiple frequency atomic force microscopy |
Oct. 20, 2009 |
| 7596990 |
Method and apparatus for obtaining quantitative measurements using a probe based instrument |
Oct. 6, 2009 |
| 7596989 |
Probe for an atomic force microscope |
Oct. 6, 2009 |
| 7594443 |
Mechanically tunable optical-encoded force sensor |
Sep. 29, 2009 |
| 7591171 |
Atomic force microscope |
Sep. 22, 2009 |
| 7591170 |
Rough road detection system |
Sep. 22, 2009 |
| 7584653 |
System for wide frequency dynamic nanomechanical analysis |
Sep. 8, 2009 |
| 7581438 |
Surface texture measuring probe and microscope utilizing the same |
Sep. 1, 2009 |
| 7578853 |
Scanning probe microscope system |
Aug. 25, 2009 |
| 7578176 |
Systems and methods for utilizing scanning probe shape characterization |
Aug. 25, 2009 |
| 7574932 |
Sample holding mechanism and sample working/observing apparatus |
Aug. 18, 2009 |
| 7574903 |
Method and apparatus of driving torsional resonance mode of a probe-based instrument |
Aug. 18, 2009 |
| 7572300 |
Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
Aug. 11, 2009 |
| 7571639 |
Method of correcting opaque defect of photomask using atomic force microscope fine processing device |
Aug. 11, 2009 |
| 7571638 |
Tool tips with scanning probe microscopy and/or atomic force microscopy applications |
Aug. 11, 2009 |
| 7569817 |
Scanning probe apparatus |
Aug. 4, 2009 |
| 7562564 |
Scanning probe microscope and sample observing method using this and semiconductor device production method |
Jul. 21, 2009 |
| 7562563 |
Apparatus for automatically inspecting road surface pavement condition |
Jul. 21, 2009 |
| 7556968 |
Scanning probe microscope and molecular structure change observation method |
Jul. 7, 2009 |
| 7555941 |
Scanner for probe microscopy |
Jul. 7, 2009 |
| 7555940 |
Cantilever free-decay measurement system with coherent averaging |
Jul. 7, 2009 |
| 7552645 |
Detection of resonator motion using piezoresistive signal downmixing |
Jun. 30, 2009 |
| 7552625 |
Force sensing integrated readout and active tip based probe microscope systems |
Jun. 30, 2009 |
| 7550311 |
Near-field optical probe based on SOI substrate and fabrication method thereof |
Jun. 23, 2009 |
| 7549325 |
Glide head with active device |
Jun. 23, 2009 |
| 7547882 |
Scan data collection for better overall data accurancy |
Jun. 16, 2009 |
| 7543482 |
Carbon thin line probe |
Jun. 9, 2009 |
| 7542872 |
Form measuring instrument, form measuring method and form measuring program |
Jun. 2, 2009 |
| 7539586 |
Correction method and measuring instrument |
May. 26, 2009 |
| 7536901 |
SPM sensor |
May. 26, 2009 |
| 7534999 |
Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope |
May. 19, 2009 |
| 7533561 |
Oscillator for atomic force microscope and other applications |
May. 19, 2009 |
| 7531795 |
Scanning microscopy using resonant quantum tunneling |
May. 12, 2009 |
| 7526949 |
High resolution coherent dual-tip scanning probe microscope |
May. 5, 2009 |
| 7523650 |
Multifunctional probe array system |
Apr. 28, 2009 |
| 7520165 |
Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure |
Apr. 21, 2009 |
| 7519502 |
Surface profile measurement processing method |
Apr. 14, 2009 |
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