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Class Information
Number: 73/104
Name: Measuring and testing > Surface and cutting edge testing
Description: Subject matter for testing surfaces and cutting edges for defects. The surface inspection includes such variations as soft spots, cracks, fissures and other flaws not elsewhere classified.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619423 |
Direct method and apparatus for testing anticorrosion performance of aqueous protective fluids with wire beam electrode sensors |
Nov. 17, 2009 |
| 7620503 |
Signal processing fault detection system |
Nov. 17, 2009 |
| 7603890 |
Method of inspecting a metal alloy part for incipient melting |
Oct. 20, 2009 |
| 7605368 |
Vibration-type cantilever holder and scanning probe microscope |
Oct. 20, 2009 |
| 7562563 |
Apparatus for automatically inspecting road surface pavement condition |
Jul. 21, 2009 |
| 7559233 |
Method for surface replication via thermoplastic media |
Jul. 14, 2009 |
| 7552645 |
Detection of resonator motion using piezoresistive signal downmixing |
Jun. 30, 2009 |
| 7553449 |
Method of determination of corrosion rate |
Jun. 30, 2009 |
| 7526948 |
Device and method for detecting foreign material on the surface of plasma processing apparatus |
May. 5, 2009 |
| 7481098 |
Method of determining depth of intergranular attack (IGA) for a metal part |
Jan. 27, 2009 |
| 7451637 |
Method of evaluating contact characteristics, and computer product |
Nov. 18, 2008 |
| 7423264 |
Atomic force microscope |
Sep. 9, 2008 |
| 7392692 |
Surface scan measuring device, surface scan measuring method, surface scan measuring program and recording medium |
Jul. 1, 2008 |
| 7367242 |
Active sensor for micro force measurement |
May. 6, 2008 |
| 7363802 |
Measurement device for electron microscope |
Apr. 29, 2008 |
| 7357017 |
Wafer level capped sensor |
Apr. 15, 2008 |
| 7350404 |
Scanning type probe microscope and probe moving control method therefor |
Apr. 1, 2008 |
| 7347084 |
Roughness measuring instrument with testing standard |
Mar. 25, 2008 |
| 7339383 |
Nanogripper device having length measuring function and method for length measurement executed with nanogripper device having length measuring function |
Mar. 4, 2008 |
| 7325445 |
Air test to determine surface roughness |
Feb. 5, 2008 |
| 7322229 |
Device and method for measuring the profile of a surface |
Jan. 29, 2008 |
| 7317992 |
Method and apparatus for inspecting dovetail edgebreak contour |
Jan. 8, 2008 |
| 7308822 |
Capillary devices for determination of surface characteristics and contact angles and methods for using same |
Dec. 18, 2007 |
| 7299701 |
Compressive fatigue and energy test apparatus and method for testing clutch plate friction materials |
Nov. 27, 2007 |
| 7278299 |
Method of processing vertical cross-section using atomic force microscope |
Oct. 9, 2007 |
| RE39803 |
Non vibrating capacitance probe for wear monitoring |
Sep. 4, 2007 |
| 7257992 |
Surface finish tester apparatus and methods |
Aug. 21, 2007 |
| 7250602 |
Probe device |
Jul. 31, 2007 |
| 7213447 |
Method and apparatus for detecting topographical features of microelectronic substrates |
May. 8, 2007 |
| 7210339 |
Adhesive compositions and method for selection thereof |
May. 1, 2007 |
| 7174775 |
Solid body surface evaluation method, magnetic disk evaluation method, magnetic disk, and manufacturing method thereof |
Feb. 13, 2007 |
| 7170055 |
Nanotube arrangements and methods therefor |
Jan. 30, 2007 |
| 7159452 |
Method for measuring a configuration of an object |
Jan. 9, 2007 |
| 7162383 |
Calibration method for surface texture measuring instrument, calibration program for surface texture measuring instrument, recording medium storing the calibration program and surface texture |
Jan. 9, 2007 |
| 7155963 |
Cleaning evaluation method for a substrate |
Jan. 2, 2007 |
| 7152461 |
Method and apparatus for determination of the depth of depressions which are formed in a mount substrate |
Dec. 26, 2006 |
| 7138627 |
Nanotube probe and method for manufacturing same |
Nov. 21, 2006 |
| 7127799 |
Head gimbal assembly method |
Oct. 31, 2006 |
| 7124625 |
Glide-height disk-tester and method of operation |
Oct. 24, 2006 |
| 7105358 |
Apparatus and method for visually identifying micro-forces with a palette of cantilever array blocks |
Sep. 12, 2006 |
| 7089674 |
Angle-measuring gauge for motorcycles and the like |
Aug. 15, 2006 |
| 7060448 |
Evaluating binding affinities by force stratification and force panning |
Jun. 13, 2006 |
| 7024924 |
Method and arrangement for determination of sharpness of chopping blades |
Apr. 11, 2006 |
| 7022976 |
Dynamically adjustable probe tips |
Apr. 4, 2006 |
| 7017397 |
Surface energy probe |
Mar. 28, 2006 |
| 7013716 |
Method and apparatus for measuring, analyzing, and characterizing irregularities on a surface of an article |
Mar. 21, 2006 |
| 7010462 |
System and method for evaluating efficiency losses for turbine components |
Mar. 7, 2006 |
| 6997046 |
Method and apparatus for fixtured wax and trace |
Feb. 14, 2006 |
| 6986280 |
Integrated measuring instrument |
Jan. 17, 2006 |
| 6970590 |
Side lit, 3D edge location method |
Nov. 29, 2005 |
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