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Class Information
Number: 716/6
Name: Data processing: design and analysis of circuit or semiconductor mask > Circuit design > Testing or evaluating > Design verification (e.g., wiring line capacitance, fan-out checking, minimum path width) > Timing analysis (e.g., delay time, path delay, latch timing)
Description: Subject matter wherein the design verification is confirmed based on timing constraints such as delay or latch timing of the circuit components.


Patents under this class:

Patent Number Title Of Patent Date Issued
7620921 IC chip at-functional-speed testing with process coverage evaluation Nov. 17, 2009
7620920 Time separated signals Nov. 17, 2009
7620857 Controllable delay device Nov. 17, 2009
7617466 Circuit conjunctive normal form generating method, circuit conjunctive normal form generating device, hazard check method and hazard check device Nov. 10, 2009
7617465 Method and mechanism for performing latch-up check on an IC design Nov. 10, 2009
7614024 Method to implement metal fill during integrated circuit design and layout Nov. 3, 2009
7614023 System for estimating a terminal capacitance and for characterizing a circuit Nov. 3, 2009
7610567 Systems and methods for performing automated conversion of representations of synchronous circuit designs to and from representations of asynchronous circuit designs Oct. 27, 2009
7610566 Method and apparatus for function decomposition Oct. 27, 2009
7607116 Method and apparatus for verifying system-on-chip model Oct. 20, 2009
7607115 System, method and computer program product for timing-independent sequential equivalence verification Oct. 20, 2009
7603639 Method, apparatus and computer program product for controlling jitter or the effects of jitter in integrated circuitry Oct. 13, 2009
7600206 Method of estimating the signal delay in a VLSI circuit Oct. 6, 2009
7600205 Net/wiring selection method, net selection method, wiring selection method, and delay improvement method Oct. 6, 2009
7599826 System and method for generating various simulation conditions for simulation analysis Oct. 6, 2009
7596775 Method for determining a standard cell for IC design Sep. 29, 2009
7596774 Hard macro with configurable side input/output terminals, for a subsystem Sep. 29, 2009
7596772 Methodology and system for setup/hold time characterization of analog IP Sep. 29, 2009
7594211 Methods and apparatuses for reset conditioning in integrated circuits Sep. 22, 2009
7594210 Timing variation characterization Sep. 22, 2009
7594209 Method for incorporating Miller capacitance effects in digital circuits for an accurate timing analysis Sep. 22, 2009
7594208 Techniques for automated sweeping of parameters in computer-aided design to achieve optimum performance and resource usage Sep. 22, 2009
7594202 Optimization of circuit designs using a continuous spectrum of library cells Sep. 22, 2009
7590964 Method and system for automatic generation of processor datapaths using instruction set architecture implementing means Sep. 15, 2009
7590961 Integrated circuit with signal skew adjusting cell selected from cell library Sep. 15, 2009
7590958 Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities Sep. 15, 2009
7590957 Method and apparatus for fixing best case hold time violations in an integrated circuit design Sep. 15, 2009
7590953 Static timing analysis and dynamic simulation for custom and ASIC designs Sep. 15, 2009
7587700 Process monitoring system and method for processing a large number of sub-micron measurement targets Sep. 8, 2009
7587699 Automated system for designing and developing field programmable gate arrays Sep. 8, 2009
7587696 Semiconductor device, layout method and apparatus and program Sep. 8, 2009
7587693 Apparatus and method of delay calculation for structured ASIC Sep. 8, 2009
7587691 Method and apparatus for facilitating variation-aware parasitic extraction Sep. 8, 2009
7587690 Method and system for global coverage analysis Sep. 8, 2009
7587689 Method of supporting wiring design, supporting apparatus using the method, and computer-readable recording medium Sep. 8, 2009
7584450 Method and apparatus for using a database to quickly identify and correct a manufacturing problem area in a layout Sep. 1, 2009
7584443 Clock domain conflict analysis for timing graphs Sep. 1, 2009
7584442 Method and apparatus for generating memory models and timing database Sep. 1, 2009
7584441 Method for generating optimized constraint systems for retimable digital designs Sep. 1, 2009
7584439 Cell modeling for integrated circuit design with characterization of upstream driver strength Sep. 1, 2009
7584438 Method for rapid estimation of layout-dependent threshold voltage variation in a MOSFET array Sep. 1, 2009
7581201 System and method for sign-off timing closure of a VLSI chip Aug. 25, 2009
7581199 Use of state nodes for efficient simulation of large digital circuits at the transistor level Aug. 25, 2009
7577933 Timing driven pin assignment Aug. 18, 2009
7577930 Method and apparatus for analyzing integrated circuit operations Aug. 18, 2009
7577928 Verification of an extracted timing model file Aug. 18, 2009
7574687 Method and system to optimize timing margin in a system in package module Aug. 11, 2009
7574344 Static timing based IR drop analysis Aug. 11, 2009
7571414 Multi-project system-on-chip and its method Aug. 4, 2009
7571407 Semiconductor integrated circuit and method of testing delay thereof Aug. 4, 2009



 
 
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