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Class Information
Number: 716/54
Name: Data processing: design and analysis of circuit or semiconductor mask >
Description:










Sub-classes under this class:

Class Number Class Name Patents
716/ Applications (364/400) 0
716/1 Circuit design 1,972
716/19 Design of semiconductor mask 1,426


Patents under this class:

Patent Number Title Of Patent Date Issued
8713485 Categorization of design rule errors Apr. 29, 2014
8713487 Sub-resolution assist feature repair Apr. 29, 2014
8713489 Simulation parameter correction technique Apr. 29, 2014
8713490 Managing aging of silicon in an integrated circuit device Apr. 29, 2014
8713499 Electron-beam lithography method with correction of line ends by insertion of contrast patterns Apr. 29, 2014
8713484 Aware manufacturing of integrated circuits Apr. 29, 2014
8707222 Lithography mask functional optimization and spatial frequency analysis Apr. 22, 2014
8707221 Circuit assembly yield prediction with respect to manufacturing process Apr. 22, 2014
8707220 Semiconductor manufacturing optimization by combining small lots into individual carriers Apr. 22, 2014
8694927 Method of designing pattern layouts Apr. 8, 2014
8694928 Pattern selection for lithographic model calibration Apr. 8, 2014
8694929 Method and apparatus for the position determination of structures on a mask for microlithography Apr. 8, 2014
8689151 Pitch-aware multi-patterning lithography Apr. 1, 2014
8689150 Method of fabricating semiconductor device Apr. 1, 2014
8689149 Multi-patterning for sharp corner printing Apr. 1, 2014
8689157 Extracting capacitance and resistance from FinFET devices Apr. 1, 2014
8683395 Method and system for feed-forward advanced process control Mar. 25, 2014
8683392 Double patterning methodology Mar. 25, 2014
8677291 Double patterning compatible colorless M1 route Mar. 18, 2014
8677293 Feasibility of IC edits Mar. 18, 2014
8671366 Estimating shape based on comparison between actual waveform and library in lithography process Mar. 11, 2014
8671367 Integrated circuit design in optical shrink technology node Mar. 11, 2014
8671368 Method, system, and program product to implement detail routing for double pattern lithography Mar. 11, 2014
8667430 Methods for directed self-assembly process/proximity correction Mar. 4, 2014
8667428 Methods for directed self-assembly process/proximity correction Mar. 4, 2014
8667427 Method of optimization of a manufacturing process of an integrated circuit layout Mar. 4, 2014
8661370 Optimization of a manufacturing process of an integrated circuit layout Feb. 25, 2014
8661373 Method for the real-time monitoring of integrated circuit manufacture through localized monitoring structures in OPC model space Feb. 25, 2014
8661374 Placement aware clock gate cloning and fanout optimization Feb. 25, 2014
8656320 Method for creating a photolithography mask Feb. 18, 2014
8656321 Method of eliminating a lithography operation Feb. 18, 2014
8656336 Pattern based method for identifying design for manufacturing improvement in a semiconductor device Feb. 18, 2014
8650512 Elastic modulus mapping of an integrated circuit chip in a chip/device package Feb. 11, 2014
8642235 Method of optimizing a die size, method of designing a pattern device manufacturing method, and computer program product Feb. 4, 2014
8645875 Method for quantifying the manufacturing complexity of electrical designs Feb. 4, 2014
8645878 Porting a circuit design from a first semiconductor process to a second semiconductor process Feb. 4, 2014
8645879 Algorithm of Cu interconnect dummy inserting Feb. 4, 2014
8645880 Sum of coherent systems (SOCS) approximation based on object information Feb. 4, 2014
8645881 Methods and apparatus for performing statistical static timing analysis Feb. 4, 2014
8645900 Tool for the type and form of a circuit production Feb. 4, 2014
8640060 Method of generating a recipe for a manufacturing tool and system thereof Jan. 28, 2014
8635582 Navigating analytical tools using layout software Jan. 21, 2014
8631359 System and technique for modeling resist profile change sensitivity at different heights Jan. 14, 2014
8631360 Methodology of optical proximity correction optimization Jan. 14, 2014
8631362 Circuit instance variation probability system and method Jan. 14, 2014
8631363 Method and mechanism for identifying and tracking shape connectivity Jan. 14, 2014
8627243 Methods for optimizing conductor patterns for ECP and CMP in semiconductor processing Jan. 7, 2014
8627241 Pattern correction with location effect Jan. 7, 2014
8627239 Mask fabrication supporting method, mask blank providing method, and mask blank dealing system Jan. 7, 2014
8627238 Process and system for designing a photolithography mask and a light source Jan. 7, 2014











 
 
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