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Class Information
Number: 716/136
Name: Data processing: design and analysis of circuit or semiconductor mask >
Description:










Sub-classes under this class:

Class Number Class Name Patents
716/ Applications (364/400) 0
716/1 Circuit design 1,972
716/19 Design of semiconductor mask 1,426


Patents under this class:

Patent Number Title Of Patent Date Issued
8713511 Tools and methods for yield-aware semiconductor manufacturing process target generation Apr. 29, 2014
8713489 Simulation parameter correction technique Apr. 29, 2014
8713510 Analysis of stress impact on transistor performance Apr. 29, 2014
8713503 Assisting apparatus, method, and program for checking crosstalk noise between hierarchized modules in a semiconductor circuit Apr. 29, 2014
8713500 Computer program and apparatus for evaluating signal propagation delays Apr. 29, 2014
8713495 Accelerator for a read-channel design and simulation tool Apr. 29, 2014
8713490 Managing aging of silicon in an integrated circuit device Apr. 29, 2014
8707245 Semiconductor device design method, system and computer-readable medium Apr. 22, 2014
8707244 Methods and systems for performing signal activity extraction Apr. 22, 2014
8707232 Fault diagnosis based on design partitioning Apr. 22, 2014
8707221 Circuit assembly yield prediction with respect to manufacturing process Apr. 22, 2014
8707243 Interface configuration system and method Apr. 22, 2014
8694934 Method and apparatus for multi-die thermal analysis Apr. 8, 2014
8694937 Implementing and checking electronic circuits with flexible ramptime limits and tools for performing the same Apr. 8, 2014
8694939 Method for determining critical junction temperature Apr. 8, 2014
8694948 Reconfigurable circuit generation device, method, and program Apr. 8, 2014
8694950 Methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness Apr. 8, 2014
8694951 Core wrapping in the presence of an embedded wrapped core Apr. 8, 2014
8689168 Reliability determination taking into account effect of component failures on circuit operation Apr. 1, 2014
8689169 Method, apparatus, and article of manufacture for providing in situ, customizable information in designing electronic circuits with electrical awareness Apr. 1, 2014
8683421 Wire harness continuity inspection method and wire harness continuity inspection program Mar. 25, 2014
8683400 System and method for fault sensitivity analysis of mixed-signal integrated circuit designs Mar. 25, 2014
8683403 Power circuit analysis apparatus and method that outputs an analysis result for segmented regions of the power circuit Mar. 25, 2014
8683405 Multi-layer distributed network Mar. 25, 2014
8683419 Power domain crossing interface analysis Mar. 25, 2014
8683420 Method and system of improved reliability testing Mar. 25, 2014
8683422 Support apparatus and information processing method thereof Mar. 25, 2014
8677306 Microcontroller controlled or direct mode controlled network-fabric on a structured ASIC Mar. 18, 2014
8671369 Quantum Karnaugh map Mar. 11, 2014
8671372 Verification support computer product, apparatus, and method Mar. 11, 2014
8671382 Method of generating RC technology file Mar. 11, 2014
8667453 Power-supply design system, power-supply design method, and program for power-supply design Mar. 4, 2014
8667452 Wireless energy transfer modeling tool Mar. 4, 2014
8667455 Hierarchical visualization-based analysis of integrated circuits Mar. 4, 2014
8667450 Validation of integrated circuit designs built with encrypted silicon IP blocks Mar. 4, 2014
8667446 Extracting high frequency impedance in a circuit design using an electronic design automation tool Mar. 4, 2014
8667440 TCAD emulation calibration method of SOI field effect transistor Mar. 4, 2014
8667436 Object identification in an electronic circuit design Mar. 4, 2014
8667431 Test coverage of integrated circuits with masking pattern selection Mar. 4, 2014
8667430 Methods for directed self-assembly process/proximity correction Mar. 4, 2014
8667428 Methods for directed self-assembly process/proximity correction Mar. 4, 2014
8667451 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit Mar. 4, 2014
8661402 Method and apparatus for AMS simulation of integrated circuit design Feb. 25, 2014
8661398 Analysis of stress impact on transistor performance Feb. 25, 2014
8661397 Systems and methods of implementing remote boundary scan features Feb. 25, 2014
8661396 DSP design system level power estimation Feb. 25, 2014
8661382 Modeling for soft error specification Feb. 25, 2014
8656341 BDD-based functional coverage analysis Feb. 18, 2014
8656340 Delay analysis apparatus, computer-readable recording medium having delay analysis program stored thereon, and delay analysis method Feb. 18, 2014
8656339 Method for analyzing sensitivity and failure probability of a circuit Feb. 18, 2014











 
 
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