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Class Information
Number: 716/112
Name: Data processing: design and analysis of circuit or semiconductor mask >
Description:










Sub-classes under this class:

Class Number Class Name Patents
716/ Applications (364/400) 0
716/1 Circuit design 1,972
716/19 Design of semiconductor mask 1,426


Patents under this class:

Patent Number Title Of Patent Date Issued
8713485 Categorization of design rule errors Apr. 29, 2014
8713486 High performance design rule checking technique Apr. 29, 2014
8707221 Circuit assembly yield prediction with respect to manufacturing process Apr. 22, 2014
8707232 Fault diagnosis based on design partitioning Apr. 22, 2014
8707233 Systems and methods for correlated parameters in statistical static timing analysis Apr. 22, 2014
8694942 Filler cells for design optimization in a place-and-route system Apr. 8, 2014
8694936 Terminal metal connection inspection Apr. 8, 2014
8694927 Method of designing pattern layouts Apr. 8, 2014
8689157 Extracting capacitance and resistance from FinFET devices Apr. 1, 2014
8689169 Method, apparatus, and article of manufacture for providing in situ, customizable information in designing electronic circuits with electrical awareness Apr. 1, 2014
8689163 Semiconductor apparatus capable of error revision using pin extension technique and design method therefor Apr. 1, 2014
8683409 Performing statistical timing analysis with non-separable statistical and deterministic variations Mar. 25, 2014
8677297 Low-overhead multi-patterning design rule check Mar. 18, 2014
8677303 Electromigration compensation system Mar. 18, 2014
8671366 Estimating shape based on comparison between actual waveform and library in lithography process Mar. 11, 2014
8667440 TCAD emulation calibration method of SOI field effect transistor Mar. 4, 2014
8661382 Modeling for soft error specification Feb. 25, 2014
8661384 Verification support apparatus, verifying apparatus, computer product, verification support method, and verifying method Feb. 25, 2014
8661385 Method and apparatus for performing delay annotation Feb. 25, 2014
8656320 Method for creating a photolithography mask Feb. 18, 2014
8656328 System and method for abstraction of a circuit portion of an integrated circuit Feb. 18, 2014
8650523 Sub-circuit models with corner instances for VLSI designs Feb. 11, 2014
8640059 Forming separation directives using a printing feasibility analysis Jan. 28, 2014
8640065 Circuit verification using computational algebraic geometry Jan. 28, 2014
8627243 Methods for optimizing conductor patterns for ECP and CMP in semiconductor processing Jan. 7, 2014
8627251 Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes Jan. 7, 2014
8621402 Model-based fill Dec. 31, 2013
8615724 Circuit assembly yield prediction with respect to form factor Dec. 24, 2013
8612913 Automated approach to planning critical signals and busses Dec. 17, 2013
8612918 Method for extracting information for a circuit design Dec. 17, 2013
8612921 Technique for modeling parasitics from layout during circuit design and for parasitic aware circuit design using modes of varying accuracy Dec. 17, 2013
8612922 Generalized constraint collection management method Dec. 17, 2013
8607169 Intelligent defect diagnosis method Dec. 10, 2013
8604619 Through silicon via keep out zone formation along different crystal orientations Dec. 10, 2013
8601419 Accurate process hotspot detection using critical design rule extraction Dec. 3, 2013
8595657 Methods of forming a photo mask Nov. 26, 2013
8595666 Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program Nov. 26, 2013
8595667 Via placement and electronic circuit design processing method and electronic circuit design utilizing same Nov. 26, 2013
8589840 Semiconductor chip design verification device Nov. 19, 2013
8589844 Methods for analyzing design rules Nov. 19, 2013
8584064 Verification support apparatus and verification support method to verify target circuit based on hardware description information Nov. 12, 2013
8578313 Pattern-clip-based hotspot database system for layout verification Nov. 5, 2013
8578309 Format conversion from value change dump (VCD) to universal verification methodology (UVM) Nov. 5, 2013
8572523 Lithography aware leakage analysis Oct. 29, 2013
8572533 Waiving density violations Oct. 29, 2013
8572534 System and method for designing multiple clock domain circuits Oct. 29, 2013
8572537 Accurate parasitic capacitance extraction for ultra large scale integrated circuits Oct. 29, 2013
8566753 Fragmentation point and simulation site adjustment for resolution enhancement techniques Oct. 22, 2013
8560992 Method for inspecting a chip layout Oct. 15, 2013
8560991 Automatic debugging using automatic input data mutation Oct. 15, 2013











 
 
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