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Class Information
Number: 714/744
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Including test pattern generator > Clock or synchronization
Description: Subject matter including a reference timing function or a clock pulse generator for causing the various parts of the device to operate on a common time base.

Patents under this class:
1 2 3 4 5 6 7 8 9 10

Patent Number Title Of Patent Date Issued
8713386 Device for increasing chip testing efficiency and method thereof Apr. 29, 2014
8688404 Method and apparatus of common time-stamping Apr. 1, 2014
8683285 Parallel packetized interconnect with simplified data link layer Mar. 25, 2014
8666007 Methods and apparatus for synchronizing communication with a memory controller Mar. 4, 2014
8635040 Signal measuring device and signal measuring method Jan. 21, 2014
8607111 Sub-instruction repeats for algorithmic pattern generators Dec. 10, 2013
8601305 System for selectively power gating function blocks having a regulator to provide normal operation power and a current limiter to provide standby power to the function blocks Dec. 3, 2013
8589109 Semiconductor circuit, semiconductor circuit test method, and semiconductor circuit test system Nov. 19, 2013
8589715 Method and system for correcting timing errors due to thermal changes within a portable computing device Nov. 19, 2013
8578227 Delay test device and system-on-chip having the same Nov. 5, 2013
8560903 System and method for executing functional scanning in an integrated circuit environment Oct. 15, 2013
8560991 Automatic debugging using automatic input data mutation Oct. 15, 2013
8555124 Apparatus and method for detecting an approaching error condition Oct. 8, 2013
8515416 Performing testing in a radio device Aug. 20, 2013
8502523 Test apparatus and test method Aug. 6, 2013
8473797 Circuits and methods for clock malfunction detection Jun. 25, 2013
8468397 Error controlling system, processor and error injection method Jun. 18, 2013
8458546 Oversampled clock and data recovery with extended rate acquisition Jun. 4, 2013
8433964 Test apparatus and test method Apr. 30, 2013
8423851 Measured device and test system utilizing the same Apr. 16, 2013
8418008 Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuit Apr. 9, 2013
8412996 Method and device for checking the integrity of a logic signal, in particular a clock signal Apr. 2, 2013
8402375 System and method for managing bookmark buttons on a browser toolbar Mar. 19, 2013
8392145 Timing generator Mar. 5, 2013
8384569 Circuit and method for generating the stochastic signal Feb. 26, 2013
8385493 Method and apparatus for improving linearity in clock and data recovery systems Feb. 26, 2013
8381050 Method and apparatus for increased effectiveness of delay and transition fault testing Feb. 19, 2013
8375259 System and method for initializing a memory system, and memory device and processor-based system using same Feb. 12, 2013
8373433 Test apparatus, test method and manufacturing method Feb. 12, 2013
8370692 Recording and/or reproducing method, recording and/or reproducing apparatus and information storage medium Feb. 5, 2013
8355480 Methods and apparatus for synchronizing communication with a memory controller Jan. 15, 2013
8352794 Control of clock gating Jan. 8, 2013
8341477 Test board having a plurality of test modules and a test system having the same Dec. 25, 2012
8301970 Sequential circuit with error detection Oct. 30, 2012
8296620 Data devices including multiple error correction codes and methods of utilizing Oct. 23, 2012
8279991 Method of efficiently synchronizing to a desired timeslot in a time division multiple access communication system Oct. 2, 2012
8265917 Co-simulation synchronization interface for IC modeling Sep. 11, 2012
8250421 Clock controller for JTAG interface Aug. 21, 2012
8225161 Retransmissions of data using increased data rate Jul. 17, 2012
8208595 Apparatus for data recovery in a synchronous chip-to-chip system Jun. 26, 2012
8189726 Methods and apparatus for operating a digital communications interface May. 29, 2012
8176370 Method and system for direct access memory testing of an integrated circuit May. 8, 2012
8170164 Transfer clocks for a multi-channel architecture May. 1, 2012
8156396 Method and system for correcting timing errors in high data rate automated test equipment Apr. 10, 2012
8145963 Semiconductor integrated circuit device and delay fault testing method thereof Mar. 27, 2012
8144689 Controlling asynchronous clock domains to perform synchronous operations Mar. 27, 2012
8122311 Apparatus and method for clock signal synchronization in JTAG testing in systems having selectable modules processing data signals at different rates Feb. 21, 2012
8103918 Clock control during self-test of multi port memory Jan. 24, 2012
8086921 System and method of clocking an IP core during a debugging operation Dec. 27, 2011
8069378 Method and apparatus for evaluating and optimizing a signaling system Nov. 29, 2011

1 2 3 4 5 6 7 8 9 10

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