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Class Information
Number: 714/742
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Including test pattern generator > Testing specific device
Description: Subject matter where the test pattern is applied to a distinctive named means to carry out a special function.

Patents under this class:
1 2 3 4 5 6 7 8 9 10 11

Patent Number Title Of Patent Date Issued
8713391 System and method for testing an integrated circuit embedded in a system on a chip Apr. 29, 2014
8713392 Circuitry testing module and circuitry testing device Apr. 29, 2014
8707113 Method for modeling a device and generating test for that device Apr. 22, 2014
8689071 Multimedia device test system Apr. 1, 2014
8656232 Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program Feb. 18, 2014
8645781 TMDS receiver system and BIST method thereof Feb. 4, 2014
8639855 Information collection and storage for single core chips to 'N core chips Jan. 28, 2014
8639995 Systems and methods for signature circuits Jan. 28, 2014
8621306 Panel driving circuit that generates panel test pattern and panel test method thereof Dec. 31, 2013
8621296 Integrated circuit devices having selectively enabled scan paths with power saving circuitry Dec. 31, 2013
8595574 Enhanced diagnosis with limited failure cycles Nov. 26, 2013
8595576 Systems and methods for evaluating and debugging LDPC iterative decoders Nov. 26, 2013
8572448 Apparatus and method for testing and debugging an integrated circuit Oct. 29, 2013
8539289 Memory testing system and method of computing device Sep. 17, 2013
8533545 Method and apparatus for system testing using multiple instruction types Sep. 10, 2013
8516317 Methods for at-speed testing of memory interface Aug. 20, 2013
8515706 Method for controlling driving of test device and analytic device for performing the same Aug. 20, 2013
8514677 Method of recording temporary defect list on write-once recording medium, method of reproducing the temporary defect list, recording and/or reproducing apparatus, and the write-once recording Aug. 20, 2013
8515416 Performing testing in a radio device Aug. 20, 2013
8504882 Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations Aug. 6, 2013
8489943 Protocol sequence generator Jul. 16, 2013
8484522 Apparatus, system, and method for bad block remapping Jul. 9, 2013
8479048 Root cause analysis method, apparatus, and program for IT apparatuses from which event information is not obtained Jul. 2, 2013
8479066 Process for making an electric testing of electronic devices Jul. 2, 2013
8468404 Method and system for reducing switching activity during scan-load operations Jun. 18, 2013
8464107 Surrogate circuit for testing an interface Jun. 11, 2013
8458539 G-ODLAT on-die logic analyzer trigger with parallel vector finite state machine Jun. 4, 2013
8448032 Performance of signature-based diagnosis for logic BIST May. 21, 2013
8438438 Enhanced diagnosis with limited failure cycles May. 7, 2013
8438442 Method and apparatus for testing a data processing system May. 7, 2013
8433964 Test apparatus and test method Apr. 30, 2013
8433990 Semiconductor test apparatus and test method Apr. 30, 2013
8429471 Microprocessor apparatus and method for securing a programmable fuse array Apr. 23, 2013
8423850 System debugging method, system debugging equipment, processor, wireless-communications interface IC and interface method thereof Apr. 16, 2013
8423846 Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methods Apr. 16, 2013
8418007 On-chip comparison and response collection tools and techniques Apr. 9, 2013
8418012 Method of analyzing the safety of a device employing on target hardware description language based fault injection Apr. 9, 2013
8418013 Method of using virtual inputs and outputs to automate testing of application software and hardware Apr. 9, 2013
8392766 Operational method of a controller of a flash memory, and associated memory device and controller thereof Mar. 5, 2013
8392778 Clock domain check method, clock domain check program, and recording medium Mar. 5, 2013
8384406 Semiconductor test apparatus and test method Feb. 26, 2013
8386866 Methods for implementing variable speed scan testing Feb. 26, 2013
8356215 Testing apparatus and method for analyzing a memory module operating within an application system Jan. 15, 2013
8352791 Configurable test suite Jan. 8, 2013
8341472 Apparatus and method for tamper protection of a microprocessor fuse array Dec. 25, 2012
RE43883 High efficiency, error minimizing coding strategy method and apparatus Dec. 25, 2012
8332695 Data storage device tester Dec. 11, 2012
8326959 Virtual production testing of large integrated products Dec. 4, 2012
8327201 Parallel testing of an integrated circuit that includes multiple dies Dec. 4, 2012
8327309 Verification of design information for controlling manufacture of a system on a chip Dec. 4, 2012

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