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Class Information
Number: 714/735
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Device response compared to input pattern
Description: Subject matter in which the operational condition of a system or device is determined by comparing the system or device response to a test signal input pattern.

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
4827396 Sequential controller May. 2, 1989
4812678 Easily testable semiconductor LSI device Mar. 14, 1989
4813001 AC calibration method and device by determining transfer characteristics Mar. 14, 1989
4777662 Optical communication process Oct. 11, 1988
4774493 Method and apparatus for transferring information into electronic systems Sep. 27, 1988
4757523 High speed testing of integrated circuit Jul. 12, 1988
4752929 Method of operating a semiconductor memory with a capability of testing, and an evaluation circuit for performing the method Jun. 21, 1988
4751636 Memory management method and apparatus for initializing and/or clearing R/W storage areas Jun. 14, 1988
4750181 Dynamic circuit checking apparatus using data input and output comparisons for testing the data integrity of a circuit Jun. 7, 1988
4734687 Monitoring Mar. 29, 1988
4724380 Integrated circuit having a built-in self test design Feb. 9, 1988
4716519 Method of checking channel connections and detecting heater circuit and temperature sensor malfunctions in multi-channel closed loop hot melt heating systems Dec. 29, 1987
4716520 Method of checking channel connections and detecting heater circuit and temperature sensor malfunctions in multi-channel closed loop hot melt heating systems Dec. 29, 1987
4713782 Method and apparatus for measuring a transfer function Dec. 15, 1987
4703483 Chip on chip type integrated circuit device Oct. 27, 1987
4698785 Method and apparatus for detecting control system data processing errors Oct. 6, 1987
4697233 Partial duplication of pipelined stack with data integrity checking Sep. 29, 1987
4692920 Apparatus for generating patterns of test signals Sep. 8, 1987
4684885 Arrangement for on-line diagnostic testing of an off-line standby processor in a duplicated processor configuration Aug. 4, 1987
4682246 Characterizing the information transfer characteristics of a recording medium Jul. 21, 1987
4675597 Circuit analyzer for measuring pulse repetition rate and pulse width Jun. 23, 1987
4667329 Diskette subsystem fault isolation via video subsystem loopback May. 19, 1987
4667330 Semiconductor memory device May. 19, 1987
4658367 Noise corrected pole and zero analyzer Apr. 14, 1987
4654808 Noise corrected pole and zero analyzer Mar. 31, 1987
4654809 Noise corrected pole and zero analyzer Mar. 31, 1987
4649538 Radio paging device with improved test modes Mar. 10, 1987
4646227 Control systems Feb. 24, 1987
4638246 Integrated circuit input-output diagnostic system Jan. 20, 1987
4636716 Device for testing units containing electrical circuits Jan. 13, 1987
4631699 Firmware simulation of diskette data via a video signal Dec. 23, 1986
4631722 Electronic controller for cyclically operating machinery Dec. 23, 1986
4630269 Methods for diagnosing malfunctions in a disk drive Dec. 16, 1986
4625313 Method and apparatus for testing electronic equipment Nov. 25, 1986
4607219 Method of inspecting semiconductor non-volatile memory devices Aug. 19, 1986
4607214 Adaptor circuit for adapting a test facility to a unit under test having a fast signal response Aug. 19, 1986
4605894 High density test head Aug. 12, 1986
4594544 Participate register for parallel loading pin-oriented registers in test equipment Jun. 10, 1986
4583041 Logic circuit test system Apr. 15, 1986
4575847 Hot carrier detection Mar. 11, 1986
4573152 Switch matrix test and control system Feb. 25, 1986
4561094 Interface checking apparatus Dec. 24, 1985
4552992 Analog signal verification circuit Nov. 12, 1985
4541066 Method and apparatus for checking the functions of a display system Sep. 10, 1985
4539517 Method for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs Sep. 3, 1985
4534030 Self-clocked signature analyzer Aug. 6, 1985
4524444 Analyzing the signal transfer characteristics of a signal processing unit Jun. 18, 1985
4506212 Method and apparatus for testing integrated circuits using AC test input and comparison of resulting frequency spectrum outputs Mar. 19, 1985
4503387 A.C. Testing of logic arrays Mar. 5, 1985
4498716 Data monitoring connector for testing transmission links Feb. 12, 1985

1 2 3 4 5 6 7 8

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