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Class Information
Number: 714/735
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Device response compared to input pattern
Description: Subject matter in which the operational condition of a system or device is determined by comparing the system or device response to a test signal input pattern.

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
5513339 Concurrent fault simulation of circuits with both logic elements and functional circuits Apr. 30, 1996
5497380 Control device for the actuation of switchgears Mar. 5, 1996
5479412 Apparatus for testing counter circuit Dec. 26, 1995
5473619 Method and apparatus for testing a driving circuit Dec. 5, 1995
5469394 Nonvolatile semiconductor memory device having a status register and test method for the same Nov. 21, 1995
5465066 Waveform formatter Nov. 7, 1995
5463700 Image processing apparatus with compression error detector Oct. 31, 1995
5459732 Method and apparatus for anti-lock brake single channel wheel speed processing with diagnosis Oct. 17, 1995
5450418 Pseudo master slave capture mechanism for scan elements Sep. 12, 1995
5444846 Image processing apparatus having diagnostic mode Aug. 22, 1995
5436856 Self testing computer system with circuits including test registers Jul. 25, 1995
5425036 Method and apparatus for debugging reconfigurable emulation systems Jun. 13, 1995
5422892 Integrated circuit test arrangement and method for maximizing the use of tester comparator circuitry to economically test wide data I/O memory devices Jun. 6, 1995
5421027 Method and apparatus for generating a pin interrupt request in a digital data processor using a dual function data direction register May. 30, 1995
5394486 Method and apparatus for monitoring image processing operations Feb. 28, 1995
5392397 Command execution system for using first and second commands to reserve and store second command related status information in memory portion respectively Feb. 21, 1995
5381418 Testable latch self checker Jan. 10, 1995
5369645 Testing integrated circuit pad input and output structures Nov. 29, 1994
5363319 Logic simulator Nov. 8, 1994
5347522 Method and apparatus for detecting pseudo noise pattern for remote loopback test Sep. 13, 1994
5339261 System for operating application software in a safety critical environment Aug. 16, 1994
5305331 Data logging apparatus with memory and pattern testing device Apr. 19, 1994
5287476 Personal computer system with storage controller controlling data transfer Feb. 15, 1994
5241550 System for accurately confirming cross-connection in a cross-connection network Aug. 31, 1993
5231640 Fault tolerant processor/memory architecture Jul. 27, 1993
5231598 Direct digital synthesis measurement signal skew tester Jul. 27, 1993
5228042 Method and circuit for testing transmission paths Jul. 13, 1993
5200960 Streaming tape diagnostic Apr. 6, 1993
5197031 Method for writing data in testing memory device and circuit for testing memory device Mar. 23, 1993
5170398 Pattern generating apparatus for memory having a logical operation function Dec. 8, 1992
5167034 Data integrity for compaction devices Nov. 24, 1992
5095418 Multiplex control system Mar. 10, 1992
5043984 Method and system for inspecting microprocessor-based unit and/or component thereof Aug. 27, 1991
5029071 Multiple data processing system with a diagnostic function Jul. 2, 1991
4996691 Integrated circuit testing method and apparatus and integrated circuit devices for use therewith Feb. 26, 1991
4993013 Monitor system for multiplex equipment Feb. 12, 1991
4991185 Method of testing n-bit programmable counters Feb. 5, 1991
4989129 Multiplex control system Jan. 29, 1991
4980890 Semiconductor integrated circuit Dec. 25, 1990
4962500 Data processor including testing structure for a barrel shifter Oct. 9, 1990
4961067 Pattern driven interrupt in a digital data processor Oct. 2, 1990
4941115 Hand-held tester for communications ports of a data processor Jul. 10, 1990
4907231 Memory cartridge-connectable electronic device such as electronic still video camera Mar. 6, 1990
4887268 Error checking apparatus Dec. 12, 1989
4876685 Failure information processing in automatic memory tester Oct. 24, 1989
4862399 Method for generating efficient testsets for a class of digital circuits Aug. 29, 1989
4857835 Global event qualification system Aug. 15, 1989
4852094 Dual path switch gate array Jul. 25, 1989
4847795 System for diagnosing defects in electronic assemblies Jul. 11, 1989
4841525 Method and arrangement for testing mega-bit memory modules with arbitrary test patterns in a multi-bit test mode Jun. 20, 1989

1 2 3 4 5 6 7 8

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