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Class Information
Number: 714/735
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Device response compared to input pattern
Description: Subject matter in which the operational condition of a system or device is determined by comparing the system or device response to a test signal input pattern.

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
7496808 Parallel bit test circuit in semiconductor memory device and associated method Feb. 24, 2009
7496809 Integrated scannable interface for testing memory Feb. 24, 2009
7496815 Method and apparatus for automatic generation of system test libraries Feb. 24, 2009
7490281 Segmented algorithmic pattern generator Feb. 10, 2009
7490227 Method and system to recreate instruction and data traces in an embedded processor Feb. 10, 2009
7484156 Apparatus and method for testing PS/2 interface Jan. 27, 2009
7484144 Testing embedded memory in an integrated circuit Jan. 27, 2009
7472322 On-chip interface trap characterization and monitoring Dec. 30, 2008
7472318 System and method for determining on-chip bit error rate (BER) in a communication system Dec. 30, 2008
7447964 Difference signal path test and characterization circuit Nov. 4, 2008
7444565 Re-programmable COMSEC module Oct. 28, 2008
7444559 Generation of memory test patterns for DLL calibration Oct. 28, 2008
7434114 Method of compensating for a byte skew of PCI express and PCI express physical layer receiver for the same Oct. 7, 2008
7433793 Error detection apparatus and method and signal extractor Oct. 7, 2008
7428679 Method for automated at-speed testing of high serial pin count multiple gigabit per second devices Sep. 23, 2008
7426668 Performing memory built-in-self-test (MBIST) Sep. 16, 2008
7409631 Error-detection flip-flop Aug. 5, 2008
7408362 Electronic package and method for testing the same Aug. 5, 2008
7401276 Semiconductor device with test circuit and test method of the same Jul. 15, 2008
7398351 Method and system for controlling access to data of a tape data storage medium using encryption/decryption of metadata Jul. 8, 2008
7376889 Memory device capable of detecting its failure May. 20, 2008
7372916 Process and devices for transmitting digital signals over buses and computer program product therefore May. 13, 2008
7363565 Method of testing apparatus having master logic unit and slave logic unit Apr. 22, 2008
7363567 System and method for electronic device testing using random parameter looping Apr. 22, 2008
7353430 Device for validating an integrated circuit Apr. 1, 2008
7334174 Semiconductor integrated circuit device and error detecting method therefor Feb. 19, 2008
7331006 Multiple sweep point testing of circuit devices Feb. 12, 2008
7284169 System and method for testing write strobe timing margins in memory devices Oct. 16, 2007
7260503 Testing using policy-based processing of test results Aug. 21, 2007
7257759 Accounting for error carryover in error correction on M-bit encoded links Aug. 14, 2007
7243283 Semiconductor device with self-test circuits and test method thereof Jul. 10, 2007
7228478 Built-in self-test (BIST) for high performance circuits Jun. 5, 2007
7228477 Apparatus and method for testing circuit units to be tested Jun. 5, 2007
7228386 Programmably disabling one or more cache entries Jun. 5, 2007
7222279 Semiconductor integrated circuit and test system for testing the same May. 22, 2007
7212941 Non-deterministic protocol packet testing May. 1, 2007
7203872 Cache based physical layer self test Apr. 10, 2007
7188290 Data alignment for telecommunications networks Mar. 6, 2007
7168019 Method and module for universal test of communication ports Jan. 23, 2007
7159157 Apparatus and method for testing a device for storing data Jan. 2, 2007
7155652 Digital signal processing for real time classification of failure bitmaps in integrated circuit technology development Dec. 26, 2006
7146556 Structured data communication with backwards compatibility Dec. 5, 2006
7127653 Apparatus and method for efficient data transport using transparent framing procedure Oct. 24, 2006
7114113 Test circuit provided with built-in self test function Sep. 26, 2006
7106108 Semiconductor integrated circuit and evaluation method of wiring in the same Sep. 12, 2006
7085610 Root cause diagnostics Aug. 1, 2006
7062686 Data copy protection using reproduction error determination and predetermined pattern recognition Jun. 13, 2006
7058909 Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit design Jun. 6, 2006
7036062 Single board DFT integrated circuit tester Apr. 25, 2006
6990620 Scanning a protocol signal into an IC for performing a circuit operation Jan. 24, 2006

1 2 3 4 5 6 7 8

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