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Class Information
Number: 714/735
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Device response compared to input pattern
Description: Subject matter in which the operational condition of a system or device is determined by comparing the system or device response to a test signal input pattern.










Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
7913137 On-chip comparison and response collection tools and techniques Mar. 22, 2011
7908108 Circuit testing apparatus Mar. 15, 2011
7900107 High speed ATPG testing circuit and method Mar. 1, 2011
7886206 Semiconductor memory test device and method thereof Feb. 8, 2011
7873891 Programmable voltage divider Jan. 18, 2011
7853846 Locating hold time violations in scan chains by generating patterns on ATE Dec. 14, 2010
7849373 Method of testing a memory module and hub of the memory module Dec. 7, 2010
7844869 Implementing enhanced LBIST testing of paths including arrays Nov. 30, 2010
7827455 System and method for detecting glitches on a high-speed interface Nov. 2, 2010
7823101 Device, method, and storage for verification scenario generation, and verification device Oct. 26, 2010
7797598 Dynamic timer for testbench interface synchronization Sep. 14, 2010
7793041 Method for controlling access to data of a tape data storage medium Sep. 7, 2010
7793177 Chip testing device and system Sep. 7, 2010
7788562 Pattern controlled, full speed ATE compare capability for deterministic and non-deterministic IC data Aug. 31, 2010
7783941 Memory devices with error detection using read/write comparisons Aug. 24, 2010
7779313 Testing apparatus and testing method Aug. 17, 2010
7739572 Tester for testing semiconductor device Jun. 15, 2010
7728601 Method of inspecting electronic circuit Jun. 1, 2010
7702981 Structural testing using boundary scan techniques Apr. 20, 2010
7689871 Method for monitoring a system Mar. 30, 2010
7676711 Test circuit for testing command signal at package level in semiconductor device Mar. 9, 2010
7676713 Automated device testing using intertwined stimulus-generation and response validation specifications for managing DUT's that generate out-of-order responses Mar. 9, 2010
7673207 Method for at speed testing of devices Mar. 2, 2010
7653847 Methods and structure for field flawscan in a dynamically mapped mass storage device Jan. 26, 2010
7650540 Detecting and differentiating SATA loopback modes Jan. 19, 2010
7650553 Semiconductor integrated circuit apparatus and interface test method Jan. 19, 2010
7650554 Method and an integrated circuit for performing a test Jan. 19, 2010
7640155 Extensible memory architecture and communication protocol for supporting multiple devices in low-bandwidth, asynchronous applications Dec. 29, 2009
7634702 Integrated circuit apparatus having improved test circuit and method of testing the integrated circuit apparatus Dec. 15, 2009
7617431 Method and apparatus for analyzing delay defect Nov. 10, 2009
7613976 Method for setting the retransmission timeout period in a packet switched communication network Nov. 3, 2009
7613973 Method for providing bitwise constraints for test generation Nov. 3, 2009
7609944 Copy protection of optical discs Oct. 27, 2009
7607056 Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices Oct. 20, 2009
7602744 Detection of a simultaneous occurrence of an event at a plurality of devices Oct. 13, 2009
7603596 Memory device capable of detecting its failure Oct. 13, 2009
7590911 Apparatus and method for testing and debugging an integrated circuit Sep. 15, 2009
7587651 Method and related apparatus for calibrating signal driving parameters between chips Sep. 8, 2009
7587645 Input circuit of semiconductor memory device and test system having the same Sep. 8, 2009
7574644 Functional pattern logic diagnostic method Aug. 11, 2009
7574633 Test apparatus, adjustment method and recording medium Aug. 11, 2009
7558941 Automatic detection of micro-tile enabled memory Jul. 7, 2009
7539903 Method for monitoring the execution of a program by comparing a request with a response and introducing a falsification in a response May. 26, 2009
7536620 Method of and apparatus for validation support, computer product for validation support May. 19, 2009
7526702 Method and system for testing a random access memory (RAM) device having an internal cache Apr. 28, 2009
7519889 System and method to reduce LBIST manufacturing test time of integrated circuits Apr. 14, 2009
7516383 Method and apparatus for analyzing delay in circuit, and computer product Apr. 7, 2009
7512854 Method and apparatus for testing, characterizing and monitoring a chip interface using a second data path Mar. 31, 2009
7506226 System and method for more efficiently using error correction codes to facilitate memory device testing Mar. 17, 2009
7506230 Transient noise detection scheme and apparatus Mar. 17, 2009

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